2020
DOI: 10.1017/s1759078720000690
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Calibration of the loop probe for the near-field measurement

Abstract: Accurate near-field measurements for either deterministic or stochastic electromagnetic fields characterization require a relevant process that removes the influence of the probes, transmission lines, and measurement circuits. The main part of the experimental work presented here is related to a calibration procedure of a test setup consisting of a microstrip test structure and a scanning loop probe. The calibration characteristic, obtained by comparing measured and simulated results, is then used to convert t… Show more

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Cited by 3 publications
(4 citation statements)
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“…• Use of a TEM structure whose fields can be either analytically described or found after numerical simulations [20].…”
Section: Probes and Characterizationmentioning
confidence: 99%
“…• Use of a TEM structure whose fields can be either analytically described or found after numerical simulations [20].…”
Section: Probes and Characterizationmentioning
confidence: 99%
“…Though with different sizes, both loops showed similar sensitivities, and the ideally-null response for the E-excitation is found to be approximately 40 dB below the expected H-excitation, in spite of the unshielded probe designs. Other methods are employed for the calibration, such as analytical formulas describing field amplitudes around TEM lines [16], which can be used to extract the absolute field levels. Another interesting method involves the use of an exciting loop whose current is sampled by a series resistor and using it as input to Ampère law, therefore computing the magnetic field at the probe position [6].…”
Section: Near-field Probes and Their Calibrationmentioning
confidence: 99%
“…Moreover, since the EMF influence can be different depending on the position, a multipoint analysis achieved by moving/translating the probe was proposed [10]. Benefiting from the case of the analyzed planar emitter coil fed by a constant frequency and the spatially symmetrical micro-construction (2.5 mm radius) of the measuring head described in our paper, its influence on the measured field was practically negligible.…”
Section: Introductionmentioning
confidence: 99%
“…Measuring the electromagnetic field in order to reduce the electromagnetic influences (EMIs) requires avoiding the disturbance of the measuring probe in the measured EM field. Because this goal cannot be assumed for any probe, the solution proposed in [10] was to calibrate the measuring probe by placing it in a well-defined reference field.…”
Section: Introductionmentioning
confidence: 99%