Capability of aTES microcalorimeter SEM‐EDS system for forensic analysis of automotive paint and gunshot residue

Nakai, Izumi; Ono, Yumie; Li, Qinghui; Nishiwaki, Yoshinori; Tánaka, Keiichi; Nakayama, Satoshi

doi:10.1002/sia.3113

Cited by 17 publications

(6 citation statements)

References 24 publications

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“…The analytical performance of SEM/EDX equipped with a transition edge sensor (TES) microcalorimeter in forensic analysis was examined. 197 The TES microcalorimeter showed much better energy resolution than the conventional solid-state detectors (SSDs), which overcame some of the identification problems caused by peak overlap when forensic samples were analyzed using a conventional SEM/EDX system based on SSDs. The microcalorimeter EDX spectrum could reveal the coexistence of Ba and S in a paint layer of an automotive white paint fragment containing TiO 2 as the pigment.…”

Section: ' X-ray Absorption Spectrometrymentioning

confidence: 99%

“…SEM/EDX provides a nondestructive microscopic morphological examination of forensic samples. The analytical performance of SEM/EDX equipped with a transition edge sensor (TES) microcalorimeter in forensic analysis was examined . The TES microcalorimeter showed much better energy resolution than the conventional solid-state detectors (SSDs), which overcame some of the identification problems caused by peak overlap when forensic samples were analyzed using a conventional SEM/EDX system based on SSDs.…”

Section: Applicationsmentioning

confidence: 99%

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X-ray Spectrometry

et al. 2011

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I n this Review, we focus on the most significant and essential progress in X-ray spectrometry (XRS) published during the period from January 2010 to August 2011 covering developments and improvements in X-ray optics, X-ray detectors, new quantification models in X-ray spectra and data evaluation, micro-X-ray fluorescence (micro-XRF) including 3D X-ray fluorescence (3D-XRF), elemental imaging techniques, electron probe microanalysis (EPMA), total reflection X-ray fluorescence (TXRF), particle-induced X-ray emission (PIXE) analysis, and X-ray absorption spectrometry (XAS). Herein, we focus on X-ray spectrometry, and thus, X-ray radiography used for only investigating inside structure images and X-ray diffraction (XRD) is not covered. However, we will introduce articles including combinations of these X-ray imaging techniques and other spectroscopic techniques. In addition, different applications in each subfield of XRS, including sample preparation, standard materials, energy-dispersive XRF (ED-XRF), and wavelength-dispersive XRF (WD-XRF), are described. We attempt to look over the current trends in this analytical field by critically citing selected papers to support the research activity of the community of X-ray scientists.Since the previous review on XRS in Analytical Chemistry, an international group of scientists published two overviews on XRS 1,2 in the Journal of Analytical Atomic Spectrometry covering the main fields of XRS analytical spectroscopic methods and instruments. These review articles involve all of the important sections of XRS in nine chapters: reviews, instrumentation, spectrum analysis, matrix correction and calibration, X-ray optics and micro fluorescence, synchrotron radiation (SR), TXRF, portable and mobile X-ray fluorescence (XRF), and online XRF and applications. The section on applications is categorized into geological and industrial minerals, environmental, archeological, cultural heritage, forensic science, etc. These review articles are useful, especially for an overall look at recent XRS research activities.The second edition of the book, "Elements of Modern X-ray Physics", was published. 3 It provides excellent explanations of the basics of X-ray physics, interactions with matter, X-ray sources,

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Section: ' X-ray Absorption Spectrometrymentioning

confidence: 99%

Section: Applicationsmentioning

confidence: 99%

X-ray Spectrometry

et al. 2011

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“…There are currently only two FE -SEM with TES -EDS systems in the world. General information on and the analytical performance of the prototype TES system were recently reported by Li et al (2009) and Nakai et al (2010). Very -high -energy resolution is the main feature of EDS -type detectors, and this enables chemical analyses at low accelerating voltages (Tanaka, et al 2006) and analyses of insulator specimens such as minerals, with no carbon coating.…”

Section: Introductionmentioning

confidence: 99%

TES microcalorimeter SEM-EDS system for rare-earth elements analyses

Uehara

Takai²,

Shirose

et al. 2012

Journal of Mineralogical and Petrological Sciences

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A field -emission scanning electron microscope (FE -SEM) with energy -dispersive X -ray spectrometer (EDS) detector of a superconducting transition -edge sensor (TES) microcalorimeter is a new system for electron -microprobe chemical analyses. FE -SEM with TES was used for qualitative and semi -quantitative analyses of rareearth elements (REE) at a low accelerating voltage of 5 kV. Four characteristic M -lines were detected in the LaB 6 spectrum: LaMζ at 640, LaMαβ at 841, LaMγ at 1021, and a weak line (M 2 N 4 transition) at 1100 eV. The spectra of other rare -earth borides, rare -earth phosphates, and monazite were assigned in the same way as the La M -lines were. For quantitative analyses, we used a calibration curve method, using standard specimens of known chemical compositions. Linear calibration curves for plots of P, Ca, La, Ce, Pr, and Nd intensities versus each weight percentage were obtained. Semi -quantitative analyses of rare -earth minerals should be carried out at low accelerating voltages using a calibration curve method. In a TES -EDS system, a low accelerating voltage can be used to improve the spatial resolution, without the sensitivity disadvantages of low -energy X -ray emissions. Moreover, a strong increase in the Mαβ intensity with increasing atomic number Z was seen, so the detection limits of heavy REE was much lower than those of light REEs. These results suggest that the TES -EDS system could be a useful analytical tool in rare -earth mineralogy.

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“…Fourier transform infrared (FTIR) spectroscopy and Raman spectroscopy are widely adopted for automotive paint analysis based on its ability to identify the binder, the main organic pigments and fillers in each layer qualitatively and quantitatively [4,6,7]. In addition, the Scanning Electron Microscope/ Energy Dispersive X-Ray system (SEM/EDS) can obtain the multilayer structure of the paints accurately and identify the elemental composition of inorganic pigments [8,9]. Gas chromatography-mass spectrometry (GC-MS) is usually used to analyze the clear coat layer [10].…”

Section: Introductionmentioning

confidence: 99%