2015
DOI: 10.1109/jmems.2014.2332991
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Capacitive-Piezoelectric Transducers for High-<inline-formula> <tex-math notation="LaTeX">$Q$ </tex-math></inline-formula> Micromechanical AlN Resonators

Abstract: A capacitive-piezoelectric (also known as, capacitive-piezo) transducer that combines the strengths of capacitive and piezoelectric mechanisms to achieve a combination of electromechanical coupling and Q higher than otherwise attainable by either mechanism separately, has allowed demonstration of a 1.2-GHz contour-mode aluminum nitride (AlN) ring resonator with Q > 3000 on par with the highest measured d 31 -transduced AlN-only piezoelectric resonators past 1 GHz, and a 50-MHz disk array with an even higher Q … Show more

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Cited by 31 publications
(13 citation statements)
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References 45 publications
(58 reference statements)
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“…[16] Due to its superior thermal stability and high mechanical quality factor, the wurtzite AlN or Al 1-x Sc x N has been investigated as a piezoelectric and optoelectronic material. [17,18] Recently, Fitchner et al demonstrated ferroelectricity in Al 1-x Sc x N under a viable operation scheme with a P r value of 100 μC cm −2 and an E c value of 2-5 MV cm −1 . [19] Extensive research revealed that the Sc in Al 1-x Sc x N can cause the flattening of the ionic potential toward the metastable hexagonal structure with a decrease in the aspect ratio of the lattice constant, i.e., the c/a value.…”
Section: Introductionmentioning
confidence: 99%
“…[16] Due to its superior thermal stability and high mechanical quality factor, the wurtzite AlN or Al 1-x Sc x N has been investigated as a piezoelectric and optoelectronic material. [17,18] Recently, Fitchner et al demonstrated ferroelectricity in Al 1-x Sc x N under a viable operation scheme with a P r value of 100 μC cm −2 and an E c value of 2-5 MV cm −1 . [19] Extensive research revealed that the Sc in Al 1-x Sc x N can cause the flattening of the ionic potential toward the metastable hexagonal structure with a decrease in the aspect ratio of the lattice constant, i.e., the c/a value.…”
Section: Introductionmentioning
confidence: 99%
“…Piezoelectric MEMS (Micro-Electro-Mechanical Systems) resonators have shown great potential for the development of high resolution and low power physical, chemical, and biological sensors [1][2][3]. Today, AlN (Aluminium Nitride) is the commonly employed material in RF (Radio Frequency) devices based on piezoelectric thin films, e.g., filters, duplexers, and other front-end modules [4,5]. Piezoelectric actuation and sensing of bulk acoustic modes of vibration in AlN-on-Si (Aluminium Nitride-on-Silicon) plate structures are made possible due to the high electromechanical coupling and high-quality factors achievable in these devices.…”
Section: Introductionmentioning
confidence: 99%
“…They possess higher electromechanical coupling coefficients, piezoelectric coefficients and dielectric constants than the other widely used materials, ZnO and AlN [1][2][3]. The composition, near morphotropic phase boundary (MPB), is the best choice for various MEMS such as accelerometer [4], hydrophone [5], acoustic imaging [6], RF MEMS [7] etc. Improvements in piezoelectric and ferroelectric properties of PZT are reported to further enhance the performance of MEMS by adding dopants in PZT thin films [8][9][10][11][12], particularly for acoustic devices, where higher piezoelectric charge coefficient and moderate dielectric constant are essential for getting better receiving sensitivity.…”
Section: Introductionmentioning
confidence: 99%