Capped Optical Polymeric Waveguide

Liu, Fuhan; Martínek, Radek; Chang, Gee‐Kung; Tummala, Rao; Adibi, Ali

doi:10.1515/joc.2007.28.2.127

Cited by 3 publications

(4 citation statements)

References 13 publications

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“…Polymer waveguide circuits investigated in this paper are fabricated and integrated on a PCB substrate using the standard low cost PCB facilities and processes in the Next Generation Substrate Laboratory at Georgia Tech Packaging Research Center. Multiple wire layers with high interconnect density are fabricated and then multimode polymeric optical waveguides are formed on the wire layers using a novel capped-waveguide technique [8]. The waveguides are formed by spin coating the polymers and then followed with photolithography process.…”

Section: Optical Polymer Waveguide Fabricationmentioning

confidence: 99%

A non-destructive characterization and real time monitor technique for low-loss, polymeric waveguide circuits

Martínek

Liu

Chang

et al. 2008

2008 58th Electronic Components and Technology Conference

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Optical polymer waveguide is a key passive component for the optical interconnection. Design, fabrication, and characterization of high performance waveguides have critical importance for the success of optoelectronic integration. In addition, defect effect, coupling, leakages and cross talk etc. are big concerns for the lightwave circuits. We present here a fast, non-destructive, sensitive, and real-time technique for detailed investigation of the propagation properties of planar optical waveguides and lightwave circuits. We use this technique to measure low loss polymer waveguides on printed circuit board (PCB) substrates and have measured the propagation loss of 0.065dB/cm at 850nm and 0.046dB/cm at 980nm. To the best of our knowledge, these are among the lowest loss data reported for polymer waveguides on PCB substrates to date. A high sensitive CCD camera with a built-in integration function is utilized to observe the light streak in two dimensions through a two lens imaging system. A few seconds to a few ten seconds is required for a complete measurement, compared to several hours for the sliding prism method and even longer for time cutback method. This technique can be used to evaluate not only the overall performance of a waveguide but also the local waveguide performance and the in-situ propagation properties (i.e., defect effect, bending effect, coupling and leakages, etc.). It can be extended to monitor the process of waveguide fabrication and alignment control during the assembly for the lightwave circuit integration.

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Section: Optical Polymer Waveguide Fabricationmentioning

confidence: 99%

A non-destructive characterization and real time monitor technique for low-loss, polymeric waveguide circuits

Martínek

Liu

Chang

et al. 2008

2008 58th Electronic Components and Technology Conference

Self Cite

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show abstract

“…We recently demonstrated a new fabrication technique for forming low-loss capped polymer waveguides using contact photolithography. 10 In this work, we present a simple, real-time, accurate, and nondestructive technique for the characterization of loss in optical waveguides that have low scattering losses, such that the application of other loss measurement techniques for the study of these waveguides is not possible.…”

mentioning

confidence: 99%

“…To improve the surface quality of these waveguides, we used a new technique in which the core and top cladding layer of the waveguide are patterned together. The details of fabrication were already reported 10 and are not repeated here. Figure 1 shows the microscope image of a high-definition and defect-free polymer capped waveguide with a core 50 m wide and 50 m thick and a 10-m-thick top cladding on an organic package substrate.…”

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confidence: 99%

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Precision measurements for propagation properties of high-definition polymer waveguides by imaging of scattered light

et al. 2008

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We present a reliable, nondestructive, and real-time technique for characterization of propagation properties of planar optical waveguides based on accurately imaging the scattered light from the optical waveguide using a sensitive charge-coupled device ͑CCD͒ camera with built-in integration functionality. This technique can be used for real-time investigation of the propagation properties ͑loss, mode profile, bending properties, etc.͒ as well as the fabrication quality of planar optical waveguides. With this technique, we evaluate high-definition polymer optical waveguides on printed circuit board ͑PCB͒ substrates with a very low loss of 0.065 dB/ cm at a wavelength of 850 nm, and measurement accuracy is less than 0.01 dB/ cm. We expect this technique with the given CCD camera to be suitable for reliably measuring loss coefficients well below 0.1 dB/ cm.

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A Real Time Precision Measurement Technique for Low Loss Optical Polymeric Waveguide

Martínek

Liu

Chang

et al. 2007

2007 8th International Conference on Electronic Packaging Technology

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Optical polymer waveguide is a key passive component for the optical interconnection. Design and fabrication of high performance waveguides has a critical importance for the success of optoelectronic integration. We present here a fast, non-destructive, sensitive, and real-time technique for detailed investigation of the propagation properties of planar optical waveguides. We use this technique to have demonstrated high performance polymer waveguides on PCB substrates with propagation loss less than 0.05dB/cm. To the best of our knowledge, this was in the lowest loss date range reported for polymer waveguides on PCB substrates to date. A high sensitive CCD camera with a built-in integration function is utilized to observe the light streak in two dimensions through a two lens imaging system. A few seconds to a few ten seconds depends on the beam scattering intensity is needed for complete one measurement, compared to the sliding prism method requiring several hours and cutback method requiring even longer time. This technique can not only be used to evaluate the overall performance of a waveguide but also local waveguide performance and in-situ investigation of the propagation properties (defect effect, mode profile, bending properties, etc.). It can be extended to monitor the process of waveguide fabrication and alignment control during the assembly for the optical circuit integration.

show abstract

Capped Optical Polymeric Waveguide

Cited by 3 publications

References 13 publications

A non-destructive characterization and real time monitor technique for low-loss, polymeric waveguide circuits

A non-destructive characterization and real time monitor technique for low-loss, polymeric waveguide circuits

Precision measurements for propagation properties of high-definition polymer waveguides by imaging of scattered light

A Real Time Precision Measurement Technique for Low Loss Optical Polymeric Waveguide

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