Growth and magnetic properties of Ni x Mn 100−x single and Co/ Ni x Mn 100−x bilayer films on Cu͑001͒ have been investigated by grazing ion scattering, Auger electron spectroscopy, low-energy electron diffraction, and magneto-optical Kerr effect. The increase in the coercivity field strength and the decrease in the signal strength of the hysteresis loop is used as a measure of the magnetic interface coupling in the bilayers. The strength of the antiferromagnetic/ferromagnetic interface coupling rapidly increases with increasing NiMn thickness. Above a critical NiMn thickness of about 8 ML, we observe the strongest interface coupling effects in the intermediate concentration regime with a Ni content 10Յ x Յ 40 at a temperature of T = 300 K and 5 Յ x Յ 50 for T = 133 K.