This document has been made available through Purdue e-Pubs, a service of the Purdue University Libraries. Please contact epubs@purdue.edu for additional information.Strus, Mark C.; Cano, Camilo I.; Pipes, R. Byron; Nguyen, Cattien V.; and Raman, Arvind, "Interfacial energy between carbon nanotubes and polymers measured from nanoscale peel tests in the atomic force microscope" (2009
b s t r a c tThe future development of polymer composite materials with nanotubes or nanoscale fibers requires the ability to understand and improve the interfacial bonding at the nanotube-polymer matrix interface. In recent work [Strus MC, Zalamea L, Raman A, Pipes RB, Nguyen CV, Stach EA. Peeling force spectroscopy: exposing the adhesive nanomechanics of one-dimensional nanostructures. Nano Lett 2008;8(2):544-50], it has been shown that a new mode in the Atomic Force Microscope (AFM), peeling force spectroscopy, can be used to understand the adhesive mechanics of carbon nanotubes peeled from a surface. In the present work, we demonstrate how AFM peeling force spectroscopy can be used to distinguish between elastic and interfacial components during a nanoscale peel test, thus enabling the direct measurement of interfacial energy between an individual nanotube or nanofiber and a given material surface. The proposed method provides a convenient experimental framework to quickly screen different combinations of polymers and functionalized nanotubes for optimal interfacial strength.Published by Elsevier Ltd.