“…The routinely used measurement techniques (e.g., X-ray fluorescence (XRF), X-ray diffraction (XRD), scanning electron microscopy (SEM)) can provide chemical and physical information, such as the chemical composition, morphology, and particle size distribution ( Contessi et al, 2021 ; Polavaram and Garg, 2021 ). Additionally, X-ray photoelectron spectroscopy (XPS), can be used for the surface characterization of the clinker composition ( Kalina et al, 2014 ; Singh et al, 2020 ). The binding energy corresponding to specific elements will shift as the chemical bonding environment changes, which provides useful information for elemental analysis ( Black et al, 2003 ).…”