Carrier lifetime measurement of perovskite films by differential microwave photoconductivity decay

Abstract

We measure the minority carrier lifetime of perovskite films by differential microwave photoconductivity decay (µ-PCD). Clear decay curves can be detected from bare and laminated methylammonium lead iodide (MAPbI3) films by the differential µ-PCD. The degradation of the bare and laminated MAPbI3 films under air exposure at room temperature is clearly observed as the continuous change of the decay curves. The differential µ-PCD can thus be a quick and non-destructive method for the characterization of the electrical quality of perovskite films and modules.

Cat-CVD SiN x as a gas barrier for application to perovskite solar cells

“…The details of the μ-PCD measurement have been described elsewhere. 24) C, the XRD patterns of most samples show typical diffraction peaks of crystal-structured Cs 0.05 FA 0.85 MA 0.1 PbI 2 Br PVK. 12,[25][26][27] When the Cat-CVD SiN x was deposited on the bare PVK at a T sub of 137 °C, all main PVK and PbI 2 peaks completely disappear leaving behind metallic Pb peaks.…”