1995
DOI: 10.4028/www.scientific.net/msf.196-201.31
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Carrier Localization in Gallium Nitride

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(2 citation statements)
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“…At 6% contraction the Fermi level is located between 0.05 and 0.10 eV below the CB edge; and at 9% contraction this interval is between 0.20 and 0.25 eV. These predicted positions of the Fermi level relative to the CB edge are in a reasonable agreement with earlier experiments of Wetzel et al [22] on the wGaN sample under pressure up to 27 GPa, and the experimental data of Perlin et al [18], which have shown an essential decrease of the c-GaN conductivity at a pressure of 20 GPa. At the same time, they do not support the latest conclusion of the same authors [26] that oxygen unintentional impurities are the only origin of the high free electron concentration in GaN crystals.…”
Section: Pressure Dependence Of Nitrogen Vacancy Levelssupporting
confidence: 82%
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“…At 6% contraction the Fermi level is located between 0.05 and 0.10 eV below the CB edge; and at 9% contraction this interval is between 0.20 and 0.25 eV. These predicted positions of the Fermi level relative to the CB edge are in a reasonable agreement with earlier experiments of Wetzel et al [22] on the wGaN sample under pressure up to 27 GPa, and the experimental data of Perlin et al [18], which have shown an essential decrease of the c-GaN conductivity at a pressure of 20 GPa. At the same time, they do not support the latest conclusion of the same authors [26] that oxygen unintentional impurities are the only origin of the high free electron concentration in GaN crystals.…”
Section: Pressure Dependence Of Nitrogen Vacancy Levelssupporting
confidence: 82%
“…This crossover shifts the vacancy level to the gap region resulting in a localization of the states accompanied by a reduction in the free carrier concentration. These characteristics have, in fact, been observed and the crossover pressure was found to be about 18 GPa [22]. Furthermore, the vacancy level was estimated to be 0.4 eV above the CB edge at ambient pressure and 0.13 eV below the edge at 27 GPa.…”
Section: Pressure Dependence Of Nitrogen Vacancy Levelsmentioning
confidence: 73%