2015
DOI: 10.1021/acs.nanolett.5b02022
|View full text |Cite
|
Sign up to set email alerts
|

Carrier Recombination Dynamics in Sulfur-Doped InP Nanowires

Abstract: Measuring lifetime of photogenerated charges in semiconductor nanowires (NW) is important for understanding light-induced processes in these materials and is relevant for their photovoltaic and photodetector applications. In this paper, we investigate the dynamics of photogenerated charge carriers in a series of as-grown InP NW with different levels of sulfur (S) doping. We observe that photoluminescence (PL) decay time as well as integrated PL intensity decreases with increasing S doping. We attribute these o… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1

Citation Types

3
31
0

Year Published

2016
2016
2024
2024

Publication Types

Select...
6

Relationship

1
5

Authors

Journals

citations
Cited by 29 publications
(34 citation statements)
references
References 46 publications
3
31
0
Order By: Relevance
“…The lateral size of these nanoplates was 300 nm, which is much smaller than that of pristine TiSe 2 . This indicates S anions can act as a growth‐control agent and lead to a decrease of the nanostructure size as previously reported . The transmission electron microscope (TEM) image (Figure b) the S‐TiSe 2 indicate that the product is hexagonal nanoplates with the edge length of about 150 nm.…”
supporting
confidence: 74%
“…The lateral size of these nanoplates was 300 nm, which is much smaller than that of pristine TiSe 2 . This indicates S anions can act as a growth‐control agent and lead to a decrease of the nanostructure size as previously reported . The transmission electron microscope (TEM) image (Figure b) the S‐TiSe 2 indicate that the product is hexagonal nanoplates with the edge length of about 150 nm.…”
supporting
confidence: 74%
“…As shown in Figure , a clear emission peak at about 470 nm for bare g‐C 3 N 4 is observed, which responds to the band‐gap electron–hole pairs recombination. Furthermore, 2.5 % PtNi x /g‐C 3 N 4 shows a weaker emission peak intensity with respect to the pure g‐C 3 N 4 , implying a lower radiative recombination of photoexcited electrons and holes in 2.5 % PtNi x /g‐C 3 N 4 ; in other words, the recombination of photogenerated charges could be suppressed efficiently after loading PtNi x on g‐C 3 N 4 .…”
Section: Evaluation Of the Separation Efficiency Of Photogenerated Chmentioning
confidence: 96%
“…For n-doped InP, the recombination is still radiative 119,120,128 , but p-doped InP has a short lifetime due to electron-acceptor recombination as shown in Fig 11. Doping related nonradiative recombination centers have also been reported for Sulphur doped InP nanowires. Zhang et al 129,130 showed that Sulphur introduces hole traps which strongly decrease the lifetime and thus also degrade the internal photoluminescence efficiency. We emphasize that more doping studies are required in the future to establish p-n doped nanowires which are capable to achieve a high internal photoluminescence efficiency at open circuit conditions.…”
Section: • 10mentioning
confidence: 99%
“…12. In these plots, these authors compare the results published by different authors 129,131,[135][136][137][138][139][140][141] with their own as-grown InP nanowires as well as with InP nanowires passivated with POx/Al2O3, deposited by atomic layer deposition (ALD). Although bulk InP is not featuring the longest reported minority carrier lifetime, the 5.4 ns lifetime from Black et al is still one of the best results published so far.…”
Section: • 10mentioning
confidence: 99%
See 1 more Smart Citation