2018
DOI: 10.1002/sia.6539
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Cathodoluminescence analysis of nonmetallic inclusions of nitrides in steel

Abstract: Identification of nitride inclusions such as boron nitride (BN) and aluminum nitride (AlN) is important in the steelmaking industry because BN inclusions deteriorate the creep strength of ferritic heat‐resistant steel, and AlN inclusions cause transverse cracking in twin‐induced‐plasticity steel. The conventional method employed for the analysis of such inclusions in steel comprises both optical microscopy and electron probe microanalysis (EPMA), which is the time‐consuming. The aim of this study is to investi… Show more

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Cited by 25 publications
(8 citation statements)
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“…The acceleration voltage of the STEM was set to 200 kV. The CL images and spectra were acquired using a custom SEM-CL system, whose details have been previously reported (Imashuku et al, 2017a(Imashuku et al, , 2017b(Imashuku et al, , 2017cImashuku & Wagatsuma, 2018, 2019a, 2019b, 2019c, 2020c, 2020dTsuneda et al, 2019). In brief, the CL images were captured through a quartz viewport attached to the SEM (Mighty-8DXL, TECHNEX, Tokyo, Japan) by a digital mirrorless camera (α7RII, Sony Corp., Tokyo, Japan) equipped with a zoom lens (LZH-10A-05T, Seimitu Wave Inc., Kyoto, Japan).…”
Section: Methodsmentioning
confidence: 99%
“…The acceleration voltage of the STEM was set to 200 kV. The CL images and spectra were acquired using a custom SEM-CL system, whose details have been previously reported (Imashuku et al, 2017a(Imashuku et al, , 2017b(Imashuku et al, , 2017cImashuku & Wagatsuma, 2018, 2019a, 2019b, 2019c, 2020c, 2020dTsuneda et al, 2019). In brief, the CL images were captured through a quartz viewport attached to the SEM (Mighty-8DXL, TECHNEX, Tokyo, Japan) by a digital mirrorless camera (α7RII, Sony Corp., Tokyo, Japan) equipped with a zoom lens (LZH-10A-05T, Seimitu Wave Inc., Kyoto, Japan).…”
Section: Methodsmentioning
confidence: 99%
“…We also acquired CL spectra of inclusions in the model steel sample using a custom SEM ‐ CL system. Details of the SEM ‐ CL system are reported in our previous papers . The measurement duration for the CL spectra was 100 s.…”
Section: Experimental Methodsmentioning
confidence: 99%
“…Details of the SEM-CL system are reported in our previous papers. [17][18][19][20] The measurement duration for the CL spectra was 100 s. Figure 2. Inclusions emitting blue, red, and green luminescences were detected in the XEOL image.…”
Section: Experimental Methodsmentioning
confidence: 99%
“…The SEM-CL system has been described in detail in our previous papers. [28][29][30][32][33][34][35][36][37][38][39][40][41][42][43][44][45][46][47][48] In brief, the CL images were captured using a digital mirrorless camera (a7RII, Sony Corp., Tokyo, Japan) equipped with a zoom lens (LZH-10A-05T, Seimitu Wave Inc., Kyoto, Japan) via a quartz viewport attached to a SEM (Mighty-8DXL, TECHNEX, Tokyo, Japan). The detectable wavelength range of the camera was from 420 to 680 nm.…”
Section: Introductionmentioning
confidence: 99%