Cathodoluminescence microscopy and spectroscopy of superconducting Bi2Sr2CaCu2O8+x single crystals

Dı́az-Guerra, C.; Piqueras, J.

doi:10.1016/s0921-4534(96)00687-9

Cited by 9 publications

(2 citation statements)

References 35 publications

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“…15,16 Our previous CL-SEM studies, performed on the same set of samples used in this work, revealed an enhanced 2.4 eV CL emission in the mentioned steps. 6 We obtained similar results in the CL characterization of Bi-2212 single crystals, 7 in which preliminary REBIC investigations also revealed PAT contrast related to growth steps. A correlation between oxygen depletion and the mentioned 2.4 eV emission has been established not only in YBCO, 3 but also in other HTSC like Tl 2 Ba 2 CuO 6ϩ␦ ͑Ref.…”

supporting

confidence: 71%

Remote electron beam induced current imaging of electrically active regions in YBa2Cu3O7−x single crystals

Dı́az-Guerra

Piqueras

1997

Applied Physics Letters

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Remote electron beam induced current (REBIC) measurements have been carried out to investigate electrically active regions in YBa2Cu3O7−x single crystals. Enhanced REBIC contrast, found in growth steps and other topographic features of the samples, is discussed in terms of charged oxygen-related defects. The capability of REBIC to image structural inhomogeneities caused by strain or plastic deformation in these crystals is also established. Charge carrier diffusion length has been estimated at different temperatures from REBIC linescan profiles.

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supporting

confidence: 71%

Remote electron beam induced current imaging of electrically active regions in YBa2Cu3O7−x single crystals

Dı́az-Guerra

Piqueras

1997

Applied Physics Letters

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“…Details of the experimental setup used for CL images and spectra acquisition have been reported elsewhere. 17,18 Measurements were performed at accelerating voltages ranging from 10 to 25 kV, beam currents ranging from 1 to 50 nA and temperatures between 85 and 295 K.…”

Section: Methodsmentioning

confidence: 99%

Defect and nanocrystal cathodoluminescence of synthetic opals infilled with Si and Pt

Dı́az-Guerra

Kurdyukov

Piqueras

et al. 2001

Journal of Applied Physics

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Synthetic opals-composed of 250 nm amorphous silica spheres closed packed in a face centered cubic structure-have been infilled with silicon, platinum, and with Si and different Pt contents. The luminescent properties of these composites have been investigated by cathodoluminescence ͑CL͒ microscopy and spectroscopy. CL emission is influenced by the material used to infill the pores of the opal matrix. CL spectra of all the samples investigated show two well-known bands, associated with the defect structure of the silica spheres, centered at about 1.9 and 2.7 eV, respectively. Emission in the 2.15-2.45 eV range, particularly intense in opal-based composites with a high Pt content, is tentatively associated with SiO 2 defects involving silicon clusters. A CL band peaked at about 3.4 eV as well as a band in the 1.50-1.75 eV range, whose peak position seems to be affected by the Pt content of the samples, are associated with the presence of Si nanocrystals. The behavior of these emissions suggests that both are related to defect states at the interface between Si nanocrystals and SiO 2 forming the opal spheres.

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Effect of low temperature short time annealing on oxygen content and surface quality of Bi2Sr2CaCu2O8+δ single crystals

Kumar

et al. 2004

Physica C: Superconductivity and its Applications

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Cathodoluminescence microscopy and spectroscopy of superconducting Bi2Sr2CaCu2O8+x single crystals

Cited by 9 publications

References 35 publications

Remote electron beam induced current imaging of electrically active regions in YBa2Cu3O7−x single crystals

Remote electron beam induced current imaging of electrically active regions in YBa2Cu3O7−x single crystals

Defect and nanocrystal cathodoluminescence of synthetic opals infilled with Si and Pt

Effect of low temperature short time annealing on oxygen content and surface quality of Bi2Sr2CaCu2O8+δ single crystals

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