Cathodoluminescent properties at nanometer resolution through <i>Z</i>-contrast scanning transmission electron microscopy

Gao, HJ; Duscher, Gerd; Kim, M.; Pennycook, S. J.; Kumar, Dhananjay; Cho, K. G.; Singh, Rajiv K.

doi:10.1063/1.127055

Cited by 8 publications

(2 citation statements)

References 14 publications

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“…More experiments are necessary to make a final conclusion or to propose a final model to describe the mechanism of the degradation process. Gao et al [21] observed porous structures in laserablation-deposited Y 2 O 3 :Eu thin films. Depending on growth conditions, a large density of voids was incorporated into the films, which leads to a much increased surface area.…”

Section: Resultsmentioning

confidence: 98%

Degradation of pulse laser deposited Y ₂ O ₃ :Eu thin film phosphor

Hillie

Ntweaeborwa

Swart

2004

phys. stat. sol. (c)

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Y 2 O 3 : Eu thin film phosphors were deposited on Si (100). These layers were subjected to a prolonged electron beam bombardment with 2 keV energy and current density of 45 mA/cm 2 , in 1 x 10 -6 Torr O 2 pressure backfilled from a base pressure of 3 x 10 -9 Torr at room temperature. Auger electron spectroscopy (AES) and Cathodoluminescence (CL) both excited by the same electron beam were used to monitor the changes in the surface chemistry of the phosphor and luminous efficiency during electron bombardment, respectively. Degradation was manifested by the depletion of oxygen on the surface of the phosphor with the consequence CL intensity decrease. However, upon coating the phosphor with a thin film of Ta 2 O 5, the depletion of O on the surface was not as severe and there was a 60 % recovery of the CL intensity.

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Section: Resultsmentioning

confidence: 98%

Degradation of pulse laser deposited Y ₂ O ₃ :Eu thin film phosphor

Hillie

Ntweaeborwa

Swart

2004

phys. stat. sol. (c)

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“…A more recent example of STEM-CL is shown in Figure 4, showing a Eu-activated Y 2 O 3 phosphor material grown by laser ablation (Gao et al 2000). The structure is quite porous and a direct correlation was found between the size of the pores and luminescent efficiency.…”

Section: Studies Of Dislocationsmentioning

confidence: 96%

Investigating the optical properties of dislocations by scanning transmission electron microscopy

Pennycook

2008

Scanning

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The scanning transmission electron microscope (STEM) allows collection of a number of simultaneous signals, such as cathodoluminescence (CL), transmitted electron intensity and spectroscopic information from individual localized defects. This review traces the development of CL and atomic resolution imaging from their early inception through to the possibilities that exist today for achieving a true atomic-scale understanding of the optical properties of individual dislocations cores. This review is dedicated to Professor David Holt, a pioneer in this field.

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