The influences of CaZrO 3 on the dielectric properties and microstructures of BaTiO 3 (BT)-based ceramics have been investigated. The experiment results showed that the dielectric constant at room temperature increased with the addition of CaZrO 3 in the range of 0-3.0 mol%, which could be explained by the growth of BT grains. XRD analysis revealed that the tetragonality declined as CaZrO 3 concentration increased. XRD patterns of BT ceramics with different amounts of CaZrO 3 doping were analyzed by a recently developed procedure-materials analysis using diffraction (MAUD), which was based on the Rietveld method combined with Fourier analysis. The results depicted that the high temperature peak of temperature-capacitance characteristics (TCC) was largely dependent on the micro-strain of samples. Furthermore, more CaZrO 3 doping resulted in lower porosity and higher density. It was revealed that proper usage of CaZrO 3 could improve the dielectric properties significantly, which was benefit to develop X8R multi-layer ceramic capacitors.