2017
DOI: 10.1109/jphotov.2016.2629841
|View full text |Cite
|
Sign up to set email alerts
|

Cd and Impurity Redistribution at the CdS/CIGS Interface After Annealing of CIGS-Based Solar Cells Resolved by Atom Probe Tomography

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

3
6
0

Year Published

2017
2017
2023
2023

Publication Types

Select...
6

Relationship

1
5

Authors

Journals

citations
Cited by 21 publications
(9 citation statements)
references
References 52 publications
3
6
0
Order By: Relevance
“…After annealing, no traces of Na were found in the bulk and interface region of CIGSe and In 2 S 3 layers, however a small amount (0.2 at.%) Na was found segregated at the In 2 S 3 / CIGSe interface for another region of the same sample (see Figure S3). The presence of Na close to the CIGSe surface has been previously reported by our group 41,42 suggesting the diffusion of Na from grain boundaries to the buffer/absorber interface. The present work agrees with the work from our group which suggests that the presence of Na at the interface does not depend on the annealing temperature but rather on the vicinity of the interface to a Na-rich CIGS grain boundary.…”
Section: Compositional Analysissupporting
confidence: 76%
“…After annealing, no traces of Na were found in the bulk and interface region of CIGSe and In 2 S 3 layers, however a small amount (0.2 at.%) Na was found segregated at the In 2 S 3 / CIGSe interface for another region of the same sample (see Figure S3). The presence of Na close to the CIGSe surface has been previously reported by our group 41,42 suggesting the diffusion of Na from grain boundaries to the buffer/absorber interface. The present work agrees with the work from our group which suggests that the presence of Na at the interface does not depend on the annealing temperature but rather on the vicinity of the interface to a Na-rich CIGS grain boundary.…”
Section: Compositional Analysissupporting
confidence: 76%
“…Because a copper sample holder was used here, the Cu signal is overestimated in both scans as well. The high Cu content inside the CdS buffer layer has been observed in many publications before, when FIB‐prepared samples are analyzed by TEM or atom probe tomography (APT) . It is suggested here, that this is likely an artifact of FIB preparation, because the GDOES measurements on the same samples showed no Cu inside the CdS layer.…”
Section: Discussion On the Impact Of Thermal Stress On Samples With (supporting
confidence: 56%
“…They found that excess Cd and Zn diffuse into the CIGSe absorber layer leading to degradation of the device performance 9 . Similar observations were confirmed by other groups 10–12 . They have however not reported the effect of Na on the cell degradation.…”
Section: Introductionsupporting
confidence: 64%