2002
DOI: 10.1002/1521-4079(200204)37:4<378::aid-crat378>3.0.co;2-e
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Cd-Doping Effects on The Properties of Polycrystalline α-In2Se3 Thin Films

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Cited by 14 publications
(16 citation statements)
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“…VRH in CoSb 3 and Ni-doped CoSb 3 bulk samples was also observed by Dyck et al 30 and Sun et al 36 However, they have obtained a much lower transition temperature of 50 K or lower, which is comparable to typical values reported in the literature. 37,38 In our case, the presence of the VRH would also support the existence of an impurity band corresponding to the low excitation energy of 20 meV.…”
Section: A Electric Transport Coefficients Of Co-sb Thin Films Deposi...supporting
confidence: 63%
“…VRH in CoSb 3 and Ni-doped CoSb 3 bulk samples was also observed by Dyck et al 30 and Sun et al 36 However, they have obtained a much lower transition temperature of 50 K or lower, which is comparable to typical values reported in the literature. 37,38 In our case, the presence of the VRH would also support the existence of an impurity band corresponding to the low excitation energy of 20 meV.…”
Section: A Electric Transport Coefficients Of Co-sb Thin Films Deposi...supporting
confidence: 63%
“…As for example, in the low temperature range (100-10 K), the conductivity is just the sum of the two contributions, σ 2 + σ 3 ; each of these contributions depends exponentially-in accordance with equation (1)-on the respective donor energies E σ 2 and E σ 3 in the regions of 210-110 K and 100-10 K, respectively. With this modification, equation (1) takes the form [9] ln(σ…”
Section: Electrical Propertiesmentioning
confidence: 99%
“…The γ values for 0.5 and 1.0 correspond to bimolecular recombination and mono molecular recombination mechanism, respectively [20]. Whereas, the value of the exponent lies between 0.5 and 1.0 for continuous distribution of trapping centers [21]. The value of γ less than unity is commonly associated with photocarrier life time determined by trapping centres within the band gap and also indicates a continuous, exponential distribution of trapping centers N(E) given by [22]:…”
Section: Measurementsmentioning
confidence: 99%