Central fringe identification by phase quadrature interferometric technique and tunable laser-diode

Lee, Ju Yi; Su, Der Chin

doi:10.1016/s0030-4018(01)01515-2

Cited by 8 publications

(2 citation statements)

References 11 publications

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“…3,5 The second configuration, which is equally useful, is called a circularpolarization interferometer. [6][7][8][9][10][11][12] This technology does not require any phase-shift or frequency-shift devices within the system and presents us with the possibility of creating a Doppler metrologyy system, which is smaller and more compact. The microscope-based interferometer presented in this paper utilizes a circular-polarization configuration due to its design size specifications.…”

Section: Introductionmentioning

confidence: 99%

Design and performance verification of a microscope-based interferometer for miniature-specimen metrology

Lee

et al. 2005

Opt. Eng

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Design and experimental verification of a microscope-based circular-polarization interferometer developed for measuring the vibration of miniature specimens is detailed. This interferometer, which comes in either a two-detector or a four-detector configuration, demonstrates that the optimum operating point of a circular-polarization interferometer depends strongly on the signal detection and processing algorithms adopted. The influence of the specimen surface optical properties on the desired operating conditions is also examined. The optimum operating point of the two-detector configuration demands that the two returning light beams emitting from the specimen possess equal intensity, which matches the understanding of traditional interferometers, where two equal interference arms achieves the best interference efficiency. Surprisingly, it appears that the optimum intensity ratio for the four-detector configuration occurs if the two interference arms possess equal intensity before it hits the specimen. That is, under the constraint of a constant light source, it appears that the optimum operating point of a fourphotodetector circular-polarization interferometer is independent of the surface optical properties. Both theoretical and experimental results that verify the interaction between the optoelectronic configuration and the signal-processing algorithms implemented are presented.

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Section: Introductionmentioning

confidence: 99%

Design and performance verification of a microscope-based interferometer for miniature-specimen metrology

Lee

et al. 2005

Opt. Eng

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“…Phase modulation or differential signal detection can be adopted for measurement of weak mode coupling [13,14] , but the complexity of the testing system will increase. This paper describes a wavelet transform method to improve the signal-to-noise ratio (SNR) of the output interferogram.…”

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confidence: 99%

Enhancement of signal-noise-ratio in a distributed polarization mode coupling detection system

Jing

Liu

et al. 2007

Optoelectron. Lett.

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A distributed polarization-mode coupling measurement system was designed and implemented using white light interferometry.It can be used for the measurement of polarization mode coupling in a high-birefringence fiber of up to 1 km. This system can be used in both fiber-optic sensors and optical fiber communications. Wavelet Transform was adopted in data processing to improve the signal-noise-ratio. The signal-noise-ratio of this system was improved more than 15 dB after denoising. The influence of denoising threshold on signal-noise-ratio and measurement accuracy was also discussed. Hilbert Transform and non-linear regression can be used in conjunction with Wavelet Transform to enhance the signal-noise-ratio and spatial resolution of this system. DOIWhite-light interferometry (WLI) is an efficient method for measurement of strain, twist, temperature, and many other physical parameters in fiber-optic measurement systems.

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Absolute Deformation Measurement Using Fiber-Optic White Light Interferometer with Two Broad-Band Sources

Sun

Wang

et al.

Sensing Issues in Civil Structural Health Monitoring

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Central fringe identification by phase quadrature interferometric technique and tunable laser-diode

Cited by 8 publications

References 11 publications

Design and performance verification of a microscope-based interferometer for miniature-specimen metrology

Design and performance verification of a microscope-based interferometer for miniature-specimen metrology

Enhancement of signal-noise-ratio in a distributed polarization mode coupling detection system

Absolute Deformation Measurement Using Fiber-Optic White Light Interferometer with Two Broad-Band Sources

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