1980
DOI: 10.1016/0040-6090(80)90584-2
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Centre-to-centre distributions of particles in discontinuous metal films

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Cited by 8 publications
(1 citation statement)
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“…While the optical response of ultrathin, semi-transparent Au island films can be conveniently measured using transmission spectroscopy, a detailed study of the morphology requires high-resolution imaging techniques. Transmission electron microscopy (TEM), commonly used for characterization of film structure down to atomic resolution, provides a quantitative description of the 2D projection of the island ensemble, but involves highly complex sample preparation due to the difficulty in separating the island film from the substrate while leaving the film intact. A better choice is scanning electron microscopy (SEM) imaging, which requires no particular sample preparation and allows imaging of Au island films with a resolution of several nanometers, as demonstrated with silicon 8 and titania substrates.…”
Section: Introductionmentioning
confidence: 99%
“…While the optical response of ultrathin, semi-transparent Au island films can be conveniently measured using transmission spectroscopy, a detailed study of the morphology requires high-resolution imaging techniques. Transmission electron microscopy (TEM), commonly used for characterization of film structure down to atomic resolution, provides a quantitative description of the 2D projection of the island ensemble, but involves highly complex sample preparation due to the difficulty in separating the island film from the substrate while leaving the film intact. A better choice is scanning electron microscopy (SEM) imaging, which requires no particular sample preparation and allows imaging of Au island films with a resolution of several nanometers, as demonstrated with silicon 8 and titania substrates.…”
Section: Introductionmentioning
confidence: 99%