2018
DOI: 10.1063/1.5047800
|View full text |Cite
|
Sign up to set email alerts
|

Challenges in materials and devices for resistive-switching-based neuromorphic computing

Abstract: This tutorial describes challenges and possible avenues for the implementation of the components of a solid-state system, which emulates a biological brain. The tutorial is devoted mostly to a charge-based (i.e. electric controlled) implementation using transition metal oxides materials, which exhibit unique properties that emulate key functionalities needed for this application. In the Introduction, we compare the main differences between a conventional computational machine, based on the Turing-von Neumann p… Show more

Help me understand this report
View preprint versions

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

3
160
0
8

Year Published

2019
2019
2024
2024

Publication Types

Select...
10

Relationship

2
8

Authors

Journals

citations
Cited by 199 publications
(179 citation statements)
references
References 175 publications
(240 reference statements)
3
160
0
8
Order By: Relevance
“…is obtained from the G R n (ω) using a formal series expansion order by order of the Dyson equation (8). As an illustration, Fig.…”
Section: The Anderson Impurity Modelmentioning
confidence: 99%
“…is obtained from the G R n (ω) using a formal series expansion order by order of the Dyson equation (8). As an illustration, Fig.…”
Section: The Anderson Impurity Modelmentioning
confidence: 99%
“…Note that although the question of the nature of RS in M/PPX/ITO structures is extremely interesting, its detailed analysis lies beyond the scope of this study. Here, based on the experimental data and on the related literature, we only make the following conclusion: the bipolar RS behavior of the investigated samples most likely originates from the formation/destruction of metal bridges (filaments) in the dielectric parylene layer due to migration of metal cations (Ag + , Cu + /Cu +2 , Al +3 or Ti +4 ) from the top electrode toward the bottom during the SET process under strong electric field [1,3,30,35,46]. In contrast, according to the molecular dynamics simulations performed by Ielmini et al [30], the conductive bridges can spontaneously break during the RESET switching as a result of atomic surface diffusion driven by the minimization of the system energy.…”
Section: Resultsmentioning
confidence: 99%
“…Критическими параметрами для использования мемристора в НВС являются число стабильных (без деградации) циклов РП из высокоомного (R o f f ) в низкоомное (R on ) состояние и обратно, отношение R o f f /R on , возможность установления произвольного резистивного состояния структуры в интервале между R on и R o f f , длительность хранения резистивных состояний, а также отсутствие электроформовки [5]. Большинство мемристивных устройств на данный момент изготавливается с использованием неорганических материалов (TiO 2 , ZnO, HfO 2 , WO 3 , SiO 2 и др.)…”
Section: поступило в редакцию 9 октября 2019 г в окончательной редакunclassified