2016 German Microwave Conference (GeMiC) 2016
DOI: 10.1109/gemic.2016.7461587
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Challenges in the design of wideband GaN-HEMT based class-G RF-power amplifiers

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Cited by 11 publications
(3 citation statements)
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“…A look-up shaping function (SF) between the instantaneous output power and drain supply voltage is generated from measured CW PAE, gain and output power. The SF and discrete voltage spacing can be tailored for maximum PAE, flat gain or any other PA metric with a drain voltage dependence [6], [9]. The four SFs used in this work are plotted in Fig.…”
Section: Supply Modulation Resultsmentioning
confidence: 99%
“…A look-up shaping function (SF) between the instantaneous output power and drain supply voltage is generated from measured CW PAE, gain and output power. The SF and discrete voltage spacing can be tailored for maximum PAE, flat gain or any other PA metric with a drain voltage dependence [6], [9]. The four SFs used in this work are plotted in Fig.…”
Section: Supply Modulation Resultsmentioning
confidence: 99%
“…The basis for estimating the crucial range of PBO is the power probability density distribution. If this function is multiplied with η drain as a function of output power and integrated over the output power range we obtain an average FS drain efficiency, which is to be maximized [13]. For a 10 dB PAPR signal, for example, high η drain must be reached in the PBO range from 4 to 15 dB.…”
Section: Optimizing Efficiency and Resonant Commutationmentioning
confidence: 99%
“…Using static measurements to extrapolate dynamic operation has been shown to be a good starting point for predicting behaviour [11], [15], but can be limited, especially for GaN HEMT devices exhibiting trapping behaviour and thermal memory. In such devices, behaviour can be expected to change during dynamic, modulated operation [14], [20], [21], further impacting the gain variation. In order to understand the fundamental mechanisms behind gain variation, in this paper, the analysis will be conducted using exclusively static measurements.…”
Section: Impact On Envelope Tracking Pasmentioning
confidence: 99%