The rate of energy loss per electron, P e , by a two-dimensional electron gas in an GaN/AlGaN heterostructure has been measured as a function of electron temperature, T e , in the range 0.4-35 K. A combination of zero and high magnetic field electrical transport measurements were used to determine T e as a function of the power dissipated in the device. It was found that P e / T n e , with n % 5 at the lowest temperatures, T e ( 2 K, while for higher temperatures, T e > 10 K, n ! 1. The experimental results are compared with numerical calculations of the energy relaxation rate. In the range of temperatures studied, emission of piezoelectrically coupled acoustic phonons was found to be the dominant energy relaxation mechanism.Introduction The process of hot carrier energy relaxation is of fundamental importance to the performance of all semiconductor electronic and optoelectronic devices. Measurement of energy relaxation rates provides information about the electron-phonon interaction which is of use in modelling device behaviour. Energy relaxation by hot two-dimensional (2D) carriers has been extensively studied in GaAs heterojunctions and quantum wells and Si MOS devices [1]. However, to date, there has been much less work with the aim of examining this process in GaN and its alloys.Recently Lee et al. [2] have reported measurements of the energy relaxation by warm 2D electrons in a GaN/AlGaN heterojunction. The temperature dependence of the amplitude of Shubnikov-de Haas (SdH) magnetoresistance oscillations was used as a thermometer for the electron temperature, T e . However, these measurements were limited by the technique to the electron temperature range T e < 4 K. Stanton et al. [3] studied the energy relaxation rate in bulk (3D) GaN samples using zero-field transport measurements to determine T e . In the low mobility samples used, this technique was applicable to a wide range of electron temperature, 1.5 K < T e < 300 K. However, in higher mobility samples, where phonon scattering makes a significant contribution to the mobility in the temperature range of interest, the technique must be used with caution [4].The main aim of the work described in this paper was to use the zero-field transport techniques to extend the measurements of Lee et al. to higher electron tempera-