Abstract:Summary: Polycrystalline silicon (poly-Si) films implanted with arsenic using beam currents of 500 µA (400˚C) and 230 µA (room temperature) have been investigated via transmission electron microscopy (TEM), secondary ion mass spectrometry (SIMS), and spreading resistance analysis (SRA). Experimental observations demonstrated the annealed high beam current-implanted poly-Si to possess inferior electrical properties compared with that implanted at a lower beam current. The reduced electrical activity of the high… Show more
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