Chapter 12 Aberration-Corrected Electron Microscopes at Brookhaven Microscopes at Brookhaven National Laboratory

Zhu, Yimei; Wall, J.

doi:10.1016/s1076-5670(08)01012-4

Cited by 10 publications

(18 citation statements)

References 29 publications

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“…The imaging system developed for simultaneous acquisition of SE and ADF image pairs was named "Hitachi HD2700C" right before its delivery to the Center for Functional Nanomaterials, Brookhaven National Laboratory. This instrument is housed in a specially designed laboratory with appreciably minimized mechanical vibration, temperature variation, and electromagnetic field [3,4]. It is the first aberration-corrected electron microscope manufactured by Hitachi and is based on HD2300A, a dedicated STEM developed a few years earlier as an alternative to the discontinued VG STEMs.…”

Section: Instrumentationmentioning

confidence: 99%

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Atomic imaging using secondary electrons in a scanning transmission electron microscope: Experimental observations and possible mechanisms

Inada

Egerton

et al. 2011

Ultramicroscopy

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We report detailed investigation of high-resolution imaging using secondary electrons (SE) with a sub-nanometer probe in an aberration-corrected transmission electron microscope, Hitachi HD2700C. This instrument also allows us to acquire the corresponding annular dark-field (ADF) images both simultaneously and separately. We demonstrate that atomic SE imaging is achievable for a wide range of elements, from uranium to carbon. Using the ADF images as a reference, we studied the SE image intensity and contrast as functions of applied bias, atomic number, crystal tilt, and thickness to shed light on the origin of the unexpected ultrahigh resolution in SE imaging. We have also demonstrated that the SE signal is sensitive to the terminating species at a crystal surface. A possible mechanism for atomic-scale SE imaging is proposed. The ability to image both the surface and bulk of a sample at atomic-scale is unprecedented, and can have important applications in the field of electron microscopy and materials characterization.

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Section: Instrumentationmentioning

confidence: 99%

“…The projector system consists of two lenses that provide considerable flexibility in choosing various camera lengths and collection angles for imaging and spectroscopy. The convergence and collection angles for various settings can be found in [3,4].…”

Section: Instrumentationmentioning

confidence: 99%

Atomic imaging using secondary electrons in a scanning transmission electron microscope: Experimental observations and possible mechanisms

Inada

Egerton

et al. 2011

Ultramicroscopy

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“…This instrument incorporates a CEOS corrector. Its performance is assessed by Inada et al [74], and Zhu and Wall 2 [211]. In recent models, self-alignment of the corrector is provided: "The corrector controller continuously analyses itself from studying its Ronchigram pattern in relation to applied parameters, and learns about itself more and more with time.…”

Section: Hitachimentioning

confidence: 99%

“…The direct determination of magnetic domain wall profiles by differential phase contrast electron microscopy. Ultramicroscopy 3,[203][204][205][206][207][208][209][210][211][212][213][214] N. H. . A calculation of bright field single-atom images in STEM with half plane detectors.…”

Section: Note On Appendices a And Bmentioning

confidence: 99%

The correction of electron lens aberrations

Hawkes

2015

Ultramicroscopy

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“…Traditionally, TEM has been the method of choice. With the development and implementation of aberration correction nanoprobe high-angle-annular-dark field (HAADF) imaging and energy loss spectroscopy in STEM become increasing popular with extraordinary ability to quantitatively study interface structure at atomic scale.At Brookhaven, we have three aberration corrected electron microscopes, i.e., the Hitachi HD2700C STEM, the FEI Titan 80-300 E-TEM, and the JEOL 2200MCO [1]. The Hitachi STEM is equipped with a cold-field-emission electron source, a probe corrector and a high-resolution energy-loss spectrometer.…”

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confidence: 99%

Imaging and Spectroscopy of Interfaces and Surfaces with Advanced Electron Microscopy

Zhu

Inada

et al. 2010

Microsc Microanal

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Of prime importance in the study of materials' interfaces is the use of Transmission Electron Microscopy (TEM) and Scanning Transmission Electron Microscopy (STEM) to examine the interfacial crystal structure, strain distribution, dopant profile and bonding state to understand the interfacial behavior. Traditionally, TEM has been the method of choice. With the development and implementation of aberration correction nanoprobe high-angle-annular-dark field (HAADF) imaging and energy loss spectroscopy in STEM become increasing popular with extraordinary ability to quantitatively study interface structure at atomic scale.At Brookhaven, we have three aberration corrected electron microscopes, i.e., the Hitachi HD2700C STEM, the FEI Titan 80-300 E-TEM, and the JEOL 2200MCO [1]. The Hitachi STEM is equipped with a cold-field-emission electron source, a probe corrector and a high-resolution energy-loss spectrometer. The Titan E-TEM has an imaging corrector and an environment cell that allows us to inject various gases up to 20mbar for in-situ chemical reaction experiment. The JEOL 2200MCO consists of an in-column omega filter, two aberration correctors and a monochromator. We have been using these instruments to study interfaces and surfaces of advanced materials. Figure 1 shows an example of studying YBa 2 Cu 3 O 7 /Pr 0.5 Ca 0.5 MnO 3 interfaces with simultaneous acquisition of HAADF-STEM and energy-loss spectroscopy imaging, utilizing the Ca-L, Mn-L, Ba-M and Pr-M /Cu-L edges, to reveal interfacial atomic arrangement, chemical composition and electronic structure of the strongly correlated functional oxide. With a 0.1nm probe of the Hitachi HD2700C we were able to determine the termination layer of the interface as well as the valence state and interfacial diffusion of the transition-metal elements in the material that exhibits intriguing physical properties. Figure 2 gives an example of atomic image of the surface structure of YBa 2 Cu 3 O 7-x superconductor recorded using secondary electrons with unprecedented resolution. The corresponding HAADF-STEM image was simultaneously acquired as a reference for quantitative analysis [2]. The ability to image surface and bulk at atomic resolution is unparalleled in comparison to any known imaging techniques and has the potential to revolutionize the field of microscopy and imaging. The method we developed can bring material research to a new dimension [3].

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Chapter 12 Aberration-Corrected Electron Microscopes at Brookhaven Microscopes at Brookhaven National Laboratory

Cited by 10 publications

References 29 publications

Atomic imaging using secondary electrons in a scanning transmission electron microscope: Experimental observations and possible mechanisms

Atomic imaging using secondary electrons in a scanning transmission electron microscope: Experimental observations and possible mechanisms

The correction of electron lens aberrations

Imaging and Spectroscopy of Interfaces and Surfaces with Advanced Electron Microscopy

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