Characterisation of polyphenylene thin films using synchrotron radiation X-ray reflectivity

Sherwood, J. N.; Shripathi, T.; Oldman, R. J.; Holmes, Paul A.; Nevin, Austin

doi:10.1088/0022-3727/23/2/020

Cited by 3 publications

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References 13 publications

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“…In addition, the 10-layer sample shows a Bragg peak, suggesting an ordered film formation. A rough estimation of the structural parameters is obtained using the Koenig and Carron equation 33,34 where h is the total film thickness and m is the order of the interference fringe. θ m is the reflection angle of the mth fringe, and θ c is the critical angle for total external reflection.…”

Section: X-ray Reflectivitymentioning

confidence: 99%

Polar Polymeric Langmuir−Blodgett Films for Optical Applications

et al. 1997

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A side-chain liquid crystalline copolymer containing ether−nitrobiphenyl groups was investigated as a nonlinear optical material. Ultrathin films have shown second harmonic generation and therefore have a variety of interesting applications. Waveguides composed of multilayers of the copolymer have been fabricated, and propagation losses as low as 2.3 dB/cm in a lowest order TE mode at 800 nm wavelength have been measured. The second harmonic coefficient is d 33 = 42.0 ± 1.7 pm/V at the 1064 nm fundamental wavelength and is consistent with an oriented gas model. From spectroscopic ellipsometry measurements the film refractive index is 2.24 ± 0.15 and the extinction coefficient ≤0.05 in the visible range of wavelengths. The monolayer and multilayer repeat structures were also studied by X-ray reflectivity and diffraction. The optical thickness and the oscillations in the reflectivity were in reasonable accord with a repeat length of about 3.6 nm.

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Section: X-ray Reflectivitymentioning

confidence: 99%