2024 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) 2024
DOI: 10.1109/sispad62626.2024.10733115
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Characteristic Variability of GAA Si NS CFETs Induced by Process Variation Effect and Intrinsic Parameter Fluctuation

Min-Hui Chuang,
Sekhar Reddy Kola,
Yiming Li
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