Antiferroelectric (AFE) ceramics are promising for applications in high-power density capacitors, transducers, etc. The forward switching field (𝐸 AFE−FE ) and backward switching field (𝐸 FE−AFE ) are critical performance indicators for AFE ceramics, and the coupling between the structure transition and domain orientation makes them different from the coercive field (𝐸 C ) of ferroelectric (FE). Moreover, in practical applications, AFE ceramics are often required to operate at varying frequencies. However, systematic studies regarding the frequency dependence of 𝐸 AFE−FE and 𝐸 FE−AFE are insufficient. In this work, Pb 0.98 La 0.02 [(Zr 0.55 Sn 0.45 ) 0.88 Ti 0.12 ] 0.995 O 3 (PLZST) AFE ceramic was fabricated, and two empirical formulas (𝐸 AFE−FE = 𝐴+𝐾 𝐴 × 𝑓 𝛽 , 𝐸 FE−AFE = 𝐹−𝐾 𝐹 × 𝑓 𝛽 ) were proposed to predict the frequency dependence of 𝐸 AFE−FE and 𝐸 FE−AFE .The formulas are based on the electric field-induced phase transition characteristics of AFE and the Kolmogorov-Avrami-Ishibashi domain nucleationswitching model. Furthermore, the dynamic hysteresis loops of PLZST at various frequencies (1-1000 Hz) and temperatures (30-230 • C) were investigated. The results show that the electric field-induced phase transition of AFE ceramic is dominated by the coupling between the structural transition and domain orientation. The domain orientation hinders the structure transition, leading to an increase in 𝐸 AFE−FE and a decrease in 𝐸 FE−AFE as the frequency of applied electric field increases. Meanwhile, the domain growth process is affected by the structure of AFE, and the value of 𝛽 (domain growth dimensionality) increases with the stability of the AFE structure. For comparison, Pb 0.86 La 0.02 Ba 0.12 [(Zr 0.55 Sn 0.45 ) 0.88 Ti 0.12 ] 0.995 O 3 (PLBZST) relaxor FE ceramic was fabricated. Due to the high mobility of the microdomain, the dynamic hysteresis loop of PLBZST ceramic exhibits excellent frequency stability. The charge-discharge experiment with an ultrahigh equivalent frequency (𝑓 equivalent >100 kHz) was performed to investigate the frequency stability of energy release of PLZST and PLBZST. The results may provide guidance for research pertaining to ceramic capacitors with high-power density and highfrequency stability.