2009
DOI: 10.1016/j.jallcom.2009.06.174
|View full text |Cite
|
Sign up to set email alerts
|

Characteristics of CuCr1−xMgxO2 films prepared by pulsed laser deposition

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
4
1

Citation Types

1
11
0

Year Published

2010
2010
2022
2022

Publication Types

Select...
10

Relationship

3
7

Authors

Journals

citations
Cited by 37 publications
(12 citation statements)
references
References 35 publications
1
11
0
Order By: Relevance
“…The highest conductivities after this value are for Mg doped samples on sapphire substrates synthesized by pulsed laser deposition (PLD) with conductivities in the 30-70 Scm −1 range. [16][17][18] In contrast (excluding the report by Nagarajan et al) most papers using amorphous substrates report conductivities in the 1-10 Scm −1 range. 19,20 The transparency of these films is degraded by the doping; reduced to 40% for a 250 nm thick film.…”
Section: Introductionmentioning
confidence: 90%
“…The highest conductivities after this value are for Mg doped samples on sapphire substrates synthesized by pulsed laser deposition (PLD) with conductivities in the 30-70 Scm −1 range. [16][17][18] In contrast (excluding the report by Nagarajan et al) most papers using amorphous substrates report conductivities in the 1-10 Scm −1 range. 19,20 The transparency of these films is degraded by the doping; reduced to 40% for a 250 nm thick film.…”
Section: Introductionmentioning
confidence: 90%
“…It can be observed that the films are single 3R phase delafossite structure. The intensity of (0 0 6) peaks do not have evident change, but the Full Width at Half Maximum (FWHM) of diffraction peaks decreases with the increasing of Mg content (the FWHM of the sample D0-D7 are 1.308 • , 1.172 • , 1.008 • and 0.810 • , respectively), which may be due to the formation of the stresses by the difference in ion size between chromium and magnesium [31][32][33]. Fig.…”
Section: Structural Propertiesmentioning
confidence: 99%
“…Up to now, the preparation of delafossite structure films has mainly been carried out by pulsed laser deposition (PLD) [22][23][24][25][26] and sputtering [4,12]. Solution methods, such as sol-gel processing, were expected to be an alternative, competitive approach to prepare these conducting oxides.…”
Section: Introductionmentioning
confidence: 99%