2012
DOI: 10.1016/j.mssp.2011.12.002
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Characteristics of germanium dry etching using inductively coupled SF6 plasma

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Cited by 18 publications
(9 citation statements)
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“…For series C1 samples, the decrease of the pressure increases the mean free path length and the average energy of ions. 37 This makes the SnO x F y passivation layer easier to be etched at a low pressure (15 mTorr), and the GeSn layer with more Sn-content could also work as the mask layer for the formation of b-Si (C1–5%). Due to the increased consumption in the SnO x F y layer, b-Si is nanocone structured (Fig.…”
Section: Resultsmentioning
confidence: 99%
“…For series C1 samples, the decrease of the pressure increases the mean free path length and the average energy of ions. 37 This makes the SnO x F y passivation layer easier to be etched at a low pressure (15 mTorr), and the GeSn layer with more Sn-content could also work as the mask layer for the formation of b-Si (C1–5%). Due to the increased consumption in the SnO x F y layer, b-Si is nanocone structured (Fig.…”
Section: Resultsmentioning
confidence: 99%
“…The thermal treatment at 350-400 • C in nitrogen atmosphere induced the splitting in Ge substrate and the formation of Ge-GaAs-on-insulator structure. In order to remove residual Ge layer, inductively coupled SF 6 plasma [16] was performed in a load-locked high-density plasma etch system consisting of an ICP chamber. Raman scattering spectroscopy using 514.5 nm light from an Ar + laser is used to monitor GaAs growth, GaAs/Ge heterostructure transfer and selective etching processes of the fabrication of GaAs-on-insulation.…”
Section: Methodsmentioning
confidence: 99%
“…Germanium (Ge) is a material which is widely used in micro-electronics, photovoltaic, and micro-optics. Plasma etching of Ge was investigated extensively and many studied have been published related to Ge etching in various configurations [9][10][11][12][13][14][15] using fluorine and chlorine-based processes. In general, both dry etching behavior and characteristics of the etched surface are similar for silicon and germanium due to their similar chemical structure [14][15][16].…”
Section: Introductionmentioning
confidence: 99%