2016
DOI: 10.1007/s11664-016-5120-2
|View full text |Cite
|
Sign up to set email alerts
|

Characteristics of Interlayer Tunneling Field-Effect Transistors Computed by a “DFT-Bardeen” Method

Help me understand this report
View preprint versions

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
2
1

Citation Types

0
24
0

Year Published

2018
2018
2022
2022

Publication Types

Select...
5

Relationship

2
3

Authors

Journals

citations
Cited by 5 publications
(24 citation statements)
references
References 40 publications
0
24
0
Order By: Relevance
“…11,12,13,17,21,22,23 The thin barriers yield large tunnel currents, as desirable for useful electronic devices. However, associated with the large currents, the effects of contact resistance can become quite significant.…”
Section: Discussionmentioning
confidence: 99%
See 4 more Smart Citations
“…11,12,13,17,21,22,23 The thin barriers yield large tunnel currents, as desirable for useful electronic devices. However, associated with the large currents, the effects of contact resistance can become quite significant.…”
Section: Discussionmentioning
confidence: 99%
“…Details of our computational method have been presented previously. 17 As an introduction to the Bardeen method, 30,31,32 we show in Fig. 2 a schematic illustration for comparing tunneling between sheets of 2D materials, as might be computed in an exact (or a non-equilibrium Green's function, NEGF) theory as compared with 33 a Bardeen method.…”
Section: Methodsmentioning
confidence: 99%
See 3 more Smart Citations