Articles you may be interested inPredictive modeling of the current density and radiative recombination in blue polymer-based light-emitting diodes J. Appl. Phys. 109, 064502 (2011); 10.1063/1.3553412Delayed electroluminescence in small-molecule-based organic light-emitting diodes: Evidence for triplet-triplet annihilation and recombination-center-mediated light-generation mechanism J. Appl. Phys. 98, 013510 (2005); 10.1063/1.1937472 Delayed recombination of detrapped space-charge carriers in poly[2-methoxy-5-( 2 ′ -ethyl-hexyloxy)-1,4phenylene vinylene]-based light-emitting diode Determination of traps in poly(p-phenylene vinylene) light emitting diodes by charge-based deep level transient spectroscopyThe current and electroluminescence transient responses of standard poly͑phenylene vinylene͒-based light-emitting devices have been investigated. The electroluminescence time response is longer ͑milliseconds scale͒ than the current switch-off time by more than one order of magnitude, in the case of small area devices ͑Ͻ0.1 cm 2 ͒. For large area devices ͑ϳ6 cm 2 ͒ the electroluminescence decay time decreases from 1.45 ms to ϳ 100 s with increasing bias voltage. The fast current decay limits the electroluminescence decay at higher voltages. Several approaches are discussed to interpret the observed slow decrease of electroluminescence after turning off the bias. One relies upon the Langevin-type bimolecular recombination kinetics which is governed by the minority carriers ͑electrons͒, and another focuses on the slow release of trapped electrons as possible explanations. Additionally, we show that the device current density is mainly determined by the transport of the fastest carriers ͑holes͒.