“…Lee et al have reported the room-temperature (RT) PL spectra of Si-doped a-plane GaN and found that broad near-band-edge (NBE) emission ranged from 3.29 to 3.41 eV, which was assigned to stacking faults. However, detailed investigation of the origin of the emission was not carried out by the authors [4]. In this study, optical properties of 2-mmthick Si-doped a-plane GaN films grown on an 8-mm-thickundoped a-plane GaN/r-plane sapphire with different carrier concentrations were investigated in detail by temperature-and excitation-intensity-dependent PL measurements.…”