2001
DOI: 10.1109/20.950955
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Characteristics of spin-valve films with non-magnetic oxide layers for specular-scattering

Abstract: We found a new spin-valve structure in which low coercivity coexists with high GMR ratio is substrate/Ta/NiFe/PtMn/CoFe/Ru/Ox/CoFe/Cu/CoFe/Cu/Ta-O. "Ox" means that Ru layer surface was exposed to oxygen gas. In this structure, the free layer is separated from the top specular layer by a copper layer and shows no increase in coercivity. Furthermore, the free layer was well oriented due to the thin oxide layer in the bottom pinned layer and the coercivity did not increase. After annealing at 295 C, GMR and the e… Show more

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Cited by 11 publications
(3 citation statements)
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“…As was found previously, a 1-nm-thick Ta layer can completely protect the samples. [28] Hence, further increasing the Ta thickness (t Ta > 2 nm) has little effect on the interface and is not expected to change the PMA.…”
Section: Perpendicular Magnetic Anisotropy In Cofeb Sandwiched By Mgo...mentioning
confidence: 99%
See 1 more Smart Citation
“…As was found previously, a 1-nm-thick Ta layer can completely protect the samples. [28] Hence, further increasing the Ta thickness (t Ta > 2 nm) has little effect on the interface and is not expected to change the PMA.…”
Section: Perpendicular Magnetic Anisotropy In Cofeb Sandwiched By Mgo...mentioning
confidence: 99%
“…Although it is hard to accurately determine how thick Ta is oxidized, 1-nm-thick Ta is enough to completely protect the samples. [28] In order to study the thickness of Ta oxide on AHE, two series of samples, Ta (0.55-5)/CoFeB (1.04)/MgO (1.1) and MgO (11)/CoFeB (1.22)/Ta (0.55-5) (T ann = 300 • C), were prepared. All the samples show squared loops, indicating 100% out-of-plane remanence.…”
Section: Anomalous Hall Effect Of Perpendicularmentioning
confidence: 99%
“…The specular scattering incorporating various types of nano-oxide layer (NOL) inside SV systems has recently become a subject of great interest with regard to increasing the magnetoresistance (MR) ratio [9][10][11]. An increase in the MR ratio results from specular reflection of electrons from the interface between ferromagnetic and nonmagnetic layers while conserving their spin direction.…”
mentioning
confidence: 99%