Abstract:Pure and Al-doped ZnO (AZO) thin films with different aluminium (Al) concentrations (Al: 0.5, 1, 2, and 3 wt.%) were prepared on p-type Si(100) substrate by a dip-coating technique using different zinc and aluminum precursors. The structural, morphological, optical and electrical properties of these films were investigated using a number of techniques, including the X-Ray Diffraction (XRD), scanning electron microscopy (SEM), Atomic force electron microscopy (AFM), ultraviolet–visible spectrophotometry, photol… Show more
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