2012
DOI: 10.1007/s12598-012-0491-x
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Characterization and analysis of DLC films with different thickness deposited by RF magnetron PECVD

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Cited by 14 publications
(3 citation statements)
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“…It further explains that the DLC coatings, with thicknesses around 1 ȝm, often exhibit high critical loads with hard materials as substrates, such as more than 100 N on Si or glass [51].…”
Section: Discussionmentioning
confidence: 99%
“…It further explains that the DLC coatings, with thicknesses around 1 ȝm, often exhibit high critical loads with hard materials as substrates, such as more than 100 N on Si or glass [51].…”
Section: Discussionmentioning
confidence: 99%
“…The Raman spectra of as grown NCDs on the Si substrate show the three important peaks, as shown in figure 2. The peaks at 1388 and 1571 cm -1 are related to D and G bands (Paul 2008;Hsu et al 2010;Vaghri et al 2011;Huang et al 2012). Whereas the D band for the NCD deposited on the Si substrate appeared at a low wavenumber at 1345 cm -1 , also the G peak position shifted to a lower wavenumber at 1517 cm -1 .…”
Section: Resultsmentioning
confidence: 97%
“…Large scale bulk film analysis by SEM-EDS and an XPS survey spectrum (Figure S3) both showed the presence of C and O, although no O-containing precursor gas was used. The presence of O is likely due to exposure of the film to the atmosphere. Its concentration was approximately 4.8 atom % by SEM-EDS and 25 atom % from the XPS survey spectrum (both not taking H into consideration). The latter high value is the result of XPS having a much smaller penetration depth (a few nm) and indicating that O was mostly present on the film surface.…”
Section: Results and Discussionmentioning
confidence: 99%