Characterization and interpretation of the quantum efficiencies of multilayer semiconductor detectors using a new theory

Abstract

On the basis of a new theory of semiconductor X-ray detector response, a new type of multilayer semiconductor detector was designed and developed for convenient energy analyses of intense incident X-ray¯ux in a cumulative-current mode. Another anticipated useful property of the developed detector is a drastic improvement in high-energy X-ray response ranging over several hundred eV. The formula for the quantum ef®ciency of multilayer semiconductor detectors and its physical interpretations are proposed and have been successfully veri®ed by synchrotron radiation experiments at the Photon Factory. These detectors are useful for data analyses under strong radiation-®eld conditions, including fusion-plasma-emitting X-rays and energetic heavyparticle beams, without the use of high-bias applications.