Characterization and Modeling of SET Generation Effects in CMOS Standard Logic Cells

Andjelković, Marko; Li, Yuanqing; Stamenković, Zoran; Krstić, Miloš; Kraemer, Rolf

doi:10.1109/iolts.2019.8854379

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Characterization and Modeling of SET Generation Effects in CMOS Standard Logic Cells

Cited by 3 publications

References 16 publications

Simulation-Based Analysis and Modeling of Generated Single Event Transient Pulse Width

Simulation-Based Analysis and Modeling of Generated Single Event Transient Pulse Width

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