1998
DOI: 10.1109/43.728919
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Characterization and parameterized generation of synthetic combinational benchmark circuits

Abstract: Mask-Programmed and Laser-Programmed Gate Array a rchitectures is hampered by the lack of realistic test circuits that exercise both the architectures and their automatic placement and routing algorithms. In this paper, we present a method and a tool for generating parameterized and realistic synthetic circuits. To obtain the realism, we p r opose a set of graph-theoretic characteristics that describe a p h ysical netlist, and have built a tool that can measure these characteristics on existing circuits. The g… Show more

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Cited by 52 publications
(74 citation statements)
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“…To remedy this, we have developed a synthetic benchmark generation technique suitable for the designs which we would like to see. There have been several attempts at generation of realistic synthetic benchmark circuits [DD96,HRGC98,SDC99], but all of these methods use particular features which reflect gate-level designs, rather than the macroblock examples we would like.…”
Section: Synthetic Benchmarksmentioning
confidence: 99%
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“…To remedy this, we have developed a synthetic benchmark generation technique suitable for the designs which we would like to see. There have been several attempts at generation of realistic synthetic benchmark circuits [DD96,HRGC98,SDC99], but all of these methods use particular features which reflect gate-level designs, rather than the macroblock examples we would like.…”
Section: Synthetic Benchmarksmentioning
confidence: 99%
“…We have thus taken the method of [HRGC98] and modified it to reflect our goals. As in the original method, distributions of various quantitative metrics are extracted from a "seed" design, and these parameters are used to randomly generate new designs which have similar characteristics.…”
Section: Synthetic Benchmarksmentioning
confidence: 99%
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“…When an equivalence class is based on the extracted characteristics of an existing seed benchmark circuit, we call the artificially generated members of the same class "clone-circuits" of the original. The work reported on in this paper formalizes and builds upon previous work [4,5,6,7] in which we created two tools: CIRC, a tool to analyze netlists and extract the properties of interest, and GEN, a tool to generate a new circuit given a set of properties. In the previous work we used pairwise comparison of clone circuits to validate the generation tool, but did not make formal definitions of clones or analyze the behaviour of equivalence classes induced by clones.…”
Section: Introductionmentioning
confidence: 99%
“…al. [4,5,6,7] have described methods and a tool for generating circuits subject to a number of statistical properties about the physical nature of the circuit.…”
Section: Introductionmentioning
confidence: 99%