Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization 2003
DOI: 10.1117/12.472390
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Characterization device for diode-laser-stack beam propagation

Abstract: High beam quality can be achieved by accurate adjustment of the mechanical and microoptical components in the manufacturing process of high power diode laser stacks. A characterization device which can determine these parameters by automatically measuring the radiation properties of high-power diode-laser stacks has been developed. The result is a mechanically robust, easy to use characterization device of high reliability suited for applications in quality control and product optimization

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“…But the error of this misalignment should be less than 5 % for both directions. 7 That means, that the beam waist is given by an error of less than 5 %. To calculate the beam parameter product, the divergence angle has to be known.…”
Section: Resultsmentioning
confidence: 99%
“…But the error of this misalignment should be less than 5 % for both directions. 7 That means, that the beam waist is given by an error of less than 5 %. To calculate the beam parameter product, the divergence angle has to be known.…”
Section: Resultsmentioning
confidence: 99%