Characterization Measurements of Sapphire and Diamond based KIDs for Polarimetric Plasma Diagnostics

Abstract

In this work we present the study and characterization measurements of Kinetic Inductance Detectors prototypes based on NbN thin films on diamond and sapphire substrates. The detectors are polarization sensitive, have multipixel design and are meant to be employed as the detecting element in a polarimetric fusion plasma diagnostic system operating at a probing frequency of 1.3 THz.