2008
DOI: 10.1109/ted.2008.926650
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Characterization, Modeling, and Application of 10-kV SiC MOSFET

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Cited by 338 publications
(114 citation statements)
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“…At a research level, much higher voltage levels have been demonstrated for both bipolar and unipolar device technologies [10,11] and SiC trench gate technology MOSFETs are being developed [12,13]. In this paper, the focus is on commercial discrete transistors.…”
Section: Sic Versus Simentioning
confidence: 99%
“…At a research level, much higher voltage levels have been demonstrated for both bipolar and unipolar device technologies [10,11] and SiC trench gate technology MOSFETs are being developed [12,13]. In this paper, the focus is on commercial discrete transistors.…”
Section: Sic Versus Simentioning
confidence: 99%
“…Spice software provides a typical MOSFET equivalent circuit model, as shown in Fig.1 (a). Reference [7] improved the typical MOSFET SPICE model according to the Sic MOSFET device characteristics, adding the temperature dependent voltage source and current source to compensate for static characteristic of Sic MOSFET, adding nonlinear capacitance between the gate and drain to describe the dynamic characteristics of Sic MOSFET. Reference [8] reuses the available built-in MOSFET models of the regular lateral MOSFET devices and propose a new model to depict the same behavior as expected by Sic device.…”
Section: The All Equivalent Circuit Modelmentioning
confidence: 99%
“…Improved model shown in Fig.1 (b). Reference [9][10][11] optimize the key parameters of the temperature dependent voltage source and current source of the model proposed by [7]. The new model is good for low temperature analysis to -25℃, which can operate for a wider temperature range.…”
Section: The All Equivalent Circuit Modelmentioning
confidence: 99%
“…Silicon carbide is another composite semiconductor that is well suited for high power and high voltage applications, with some devices operating up to 10 kV [37]. Like its wide-bandgap counterparts, it has demonstrated an extreme resistance to radiation damage [38].…”
Section: Silicon Carbidementioning
confidence: 99%