2014
DOI: 10.1016/j.jcrysgro.2014.03.050
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Characterization of 4in VGF-GaAs single crystals grown in a heater-magnet module

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Cited by 3 publications
(1 citation statement)
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“…In the past few years, successful control of the melt motion by TMF particularly boosted further development of VGF single-crystal growth. TMF and its Lorentz forces alter the flow and the convective heat transport, particularly in the vicinity of the growing interface. The changed flow pattern affects the interface morphology by reducing the level of interface bending, as shown experimentally for Ge and GaAs and numerically for GaAs, Ge, Si, CdTe, and BaF 2 . We also obtained promising numerical results of interface shaping by downward TMF during accelerated growth of 4 in. VGF GaAs over the range of crystal growth rates from 3 to 9 mm/h .…”
Section: Introductionsupporting
confidence: 57%
“…In the past few years, successful control of the melt motion by TMF particularly boosted further development of VGF single-crystal growth. TMF and its Lorentz forces alter the flow and the convective heat transport, particularly in the vicinity of the growing interface. The changed flow pattern affects the interface morphology by reducing the level of interface bending, as shown experimentally for Ge and GaAs and numerically for GaAs, Ge, Si, CdTe, and BaF 2 . We also obtained promising numerical results of interface shaping by downward TMF during accelerated growth of 4 in. VGF GaAs over the range of crystal growth rates from 3 to 9 mm/h .…”
Section: Introductionsupporting
confidence: 57%