1978 International Electron Devices Meeting 1978
DOI: 10.1109/iedm.1978.189467
|View full text |Cite
|
Sign up to set email alerts
|

Characterization of a 32×32 InSb hybrid IR focal plane

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

1
0
0

Year Published

1985
1985
1985
1985

Publication Types

Select...
1

Relationship

0
1

Authors

Journals

citations
Cited by 1 publication
(1 citation statement)
references
References 1 publication
1
0
0
Order By: Relevance
“…Some of this degradation could be due to inefficiency of charge transfer, though some of it could also result from imperfect optics (e.g., vignetting of detectors at the peripheries). This gives a lower limit on the charge transfer efficiency which is consistent with that measured by the SBRC (Parrish et al 1978), and is entirely adequate for good quality imaging.…”
Section: Charge Transfer Efficiencysupporting
confidence: 77%
“…Some of this degradation could be due to inefficiency of charge transfer, though some of it could also result from imperfect optics (e.g., vignetting of detectors at the peripheries). This gives a lower limit on the charge transfer efficiency which is consistent with that measured by the SBRC (Parrish et al 1978), and is entirely adequate for good quality imaging.…”
Section: Charge Transfer Efficiencysupporting
confidence: 77%