Characterization of Al and Mg Alloys from Their X-Ray Emission Bands

Abstract

The valence states of Mg-Al alloys are compared to those of reference materials (pure Mg and Al metals, and intermetallics). Two methods based on x-ray emission spectroscopy are proposed to determine the phases and their proportion: first, by analyzing the Al valence spectra of the Mg-rich alloys and the Mg valence spectra of the Al-rich alloys; second by fitting with a linear combination of the reference spectra the Al spectra of the Al-rich alloys and the Mg spectra of the Mg-rich alloys. This enables us to determine that Al and Al 3 Mg 2 are present in the 0 -43.9 wt% Al composition range and Mg and Al 12 Mg 17 are present in the 62.5 -100 wt% Al composition range. In the 43.9 -62.5%Al range, the alloy is single phase and an underestimation of the Al content of the alloy can be estimated from the comparison of the bandwidth of the alloy spectrum to the bandwidths of the reference spectra.

Nanometer‐designed Al/SiC periodic multilayers: characterization by a multi‐technique approach

“…the low Si concentration does not disturb the Al electronic structure. [14] The Al band presents a large peak, ∼10 eV wide, with a sharp discontinuity marking the Fermi level at 1559.3 eV. The background is lower for photon energies beyond the Fermi level because of the strong self-absorption of the emitted photons in this range.…”

Investigation of the thermal stability of Mg/Co periodic multilayers for EUV applications

“…We have performed XES with a high-resolution wavelength dispersive spectrometer [17] [27,28]. The energy of the incident electrons used to produce the ionizations necessary to induce the electron transitions was set to 7.5 keV.…”

“…We observed the shape of the Mg Kβ emission band from the 3p-1s transition which describes the Mg 3p valence states. They are sensitive to the chemical state of the Mg atoms [27,28]. The energy of the incident electrons used to produce the ionizations necessary to induce the electron transitions was set to 7.5 keV.…”

Study of buried interfaces in Fe/Si multilayer by hard x‐ray emission spectroscopy

“…Hence, XES was shown to provide sensitive information about the physical chemical environment of the emitting elements in multilayers. [4][5][6][7] Until now, XES has been applied in the soft x-ray region (photon energy ≤ 2 keV) to study the buried layers and interfaces.…”