1992 IEEE Microwave Symposium Digest MTT-S
DOI: 10.1109/mwsym.1992.188193
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Characterization of anisotropic substrate materials for microwave applications

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Cited by 13 publications
(13 citation statements)
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“…The ERP obtained from the present model has also been compared with results obtained by Fritsch and Wolff [6] in Table 1 considering Spectrum Domain Analysis (SDA) using Galerkin method [6] and maximum deviation of about 0.5% with our present model is seen that proves the validity of our model. Before calculating the e Moreover, these results are also obtained from the EM simulator-EMPIRE v-4.20 [11] considering the same set of parameters as considered by Alexopoulos and Krowne [3] in Figs.…”
Section: Stepsupporting
confidence: 67%
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“…The ERP obtained from the present model has also been compared with results obtained by Fritsch and Wolff [6] in Table 1 considering Spectrum Domain Analysis (SDA) using Galerkin method [6] and maximum deviation of about 0.5% with our present model is seen that proves the validity of our model. Before calculating the e Moreover, these results are also obtained from the EM simulator-EMPIRE v-4.20 [11] considering the same set of parameters as considered by Alexopoulos and Krowne [3] in Figs.…”
Section: Stepsupporting
confidence: 67%
“…Figure 6 (a and b) compares the results against the experimental results of Fritsch and Wolff [6]. The present model has been used along with the dispersion model of Jensen et al [14] to compute the dispersion in microstrip line on Sapphire substrate for h=0.4 mm and w=0.4 mm, 0.6 mm up to 30 GHz.…”
Section: Stepmentioning
confidence: 90%
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“…The substrate gyrotropy will not be considered here. Initially the uniaxial anisotropy is connected mainly with the crystallography properties of the optical glasses, microwave ceramics (van Heuven & Vlek, 1972;Fritsch & Wolff, 1992) and liquid crystals (Gaebler et al, 2008). These materials are homogeneous, but anisotropic due to their crystalline anisotropy -different dielectric parameters along to their main crystallographic axes.…”
Section: Characterization Of the Substrate Dielectric Parameters And mentioning
confidence: 99%
“…An effort has been made by several investigators to account for the effect of anisotropy on the effective relative permittivity and characteristic impedance of a microstrip line Owens, Aitken and Edwards 1976;Alexopoulos and Krowne 1978;Alexopoulos 1985;Tsalamengas, Uzunoglu and Alexopoulos 1985;Hoffmann 1987;Fritsch and Wolff 1992). The closed-form expressions are reported that convert the anisotropic substrate to the equivalent isotropic substrate with equivalent substrate thickness.…”
Section: Introductionmentioning
confidence: 99%