2018
DOI: 10.1002/adma.201706704
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Characterization of Atomic Structures of Nanosized Intermetallic Compounds Using Electron Diffraction Methods

Abstract: In metallurgy, many intermetallic compounds crystallize as nanosized particles in metallic matrices. These particles influence dramatically the physical properties of engineering materials such as alloys and steels. Since properties and crystal structure are intimately linked, characterization of the atomic model of these intermetallides is crucial for the development of new alloys. However, this structural information usually cannot be attained using traditional X-ray diffraction methods, limited by the small… Show more

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Cited by 7 publications
(3 citation statements)
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“…The small size of the particles and their small fraction in the product precluded use of x-ray diffraction to characterize the phase. Instead, advanced electron diffraction methods [17] were applied and uncovered a simple cubic structure with a 64-atom unit-cell and space group P2 1 3. This novel phase was denoted as the π-phase.…”
Section: Introductionmentioning
confidence: 99%
“…The small size of the particles and their small fraction in the product precluded use of x-ray diffraction to characterize the phase. Instead, advanced electron diffraction methods [17] were applied and uncovered a simple cubic structure with a 64-atom unit-cell and space group P2 1 3. This novel phase was denoted as the π-phase.…”
Section: Introductionmentioning
confidence: 99%
“…Electron crystallography has recently emerged as an alternative method to conventional X-ray crystallography tools. [35][36][37] In particular, the sample size required for electron crystallography is much smaller ( � 10 nm) than that required for single-crystal XRD. This merit is critical for the investigation of type-II RP because large-sized single crystals are unavailable to date.…”
Section: Resultsmentioning
confidence: 99%
“…We employed 3D electron diffraction to obtain unit cell information on type‐II RP. Electron crystallography has recently emerged as an alternative method to conventional X‐ray crystallography tools [35–37] . In particular, the sample size required for electron crystallography is much smaller (≈10 nm) than that required for single‐crystal XRD.…”
Section: Resultsmentioning
confidence: 99%