1996
DOI: 10.1002/(sici)1096-9918(199611)24:12<794::aid-sia185>3.0.co;2-a
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Characterization of bis-(phenoxy)phosphazene Polymers Using Static Secondary Ion Mass Spectrometry

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Cited by 13 publications
(8 citation statements)
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“…Third, secondary ion mass spectrometry (SIMS) was performed. This technique is extremely sensitive, and has been successfully applied to the analysis of phosphazene polymers 13. The spectra that were produced were consistent with that expected for the MEEP polymer, with absolutely no peaks detected at either mass 35 or mass 37.…”
Section: Discussionsupporting
confidence: 56%
“…Third, secondary ion mass spectrometry (SIMS) was performed. This technique is extremely sensitive, and has been successfully applied to the analysis of phosphazene polymers 13. The spectra that were produced were consistent with that expected for the MEEP polymer, with absolutely no peaks detected at either mass 35 or mass 37.…”
Section: Discussionsupporting
confidence: 56%
“…In this respect, Groenewold et al (1996) reported a remarkable observation. A phosphazene polymer sample was bombarded with a high dose of 1X6 Â 10 13 ReO À 4 primary ions of 10 keV, exposed to air and reintroduced for analysis.…”
Section: In¯uence Of Ion Dose and Damage Cross Sectionmentioning
confidence: 88%
“…Using the polymer ion formation model of Section IV.D, it is readily conceivable that fragments coming from the near impact high energy zone have a different s than ions from the low energy peripheral region. Groenewold et al (1996) observed that phosphazene polymer signals under ReO À 4 primary ion bombardment did not decay according to a ®rst-order ablation process but that a second decay mechanism with different rate must be involved. Secondary ions from the organic pendant groups decayed two to four times faster than the ions from the polymer backbone.…”
Section: In¯uence Of Ion Dose and Damage Cross Sectionmentioning
confidence: 99%
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“…In the past, a number of analytical methods have been employed to characterize the surface of membranes, see Xu et al 11 for an overview. The list of suitable methods includes confocal LSM, 12,13 scanning electron microscopy (SEM), 14,15 atomic force microscopy (AFM), 16,17 X-ray photoelectron spectroscopy (XPS), 18,19 mass spectrometry (MS), 20,21 and energy dispersive X-ray (EDX) spectroscopy. 22,23 Attenuated total reflection infrared (ATR-IR) spectroscopy is another powerful and versatile technique for the characterization of membrane surfaces.…”
Section: Introductionmentioning
confidence: 99%