Characterization of Black Carbon in Fine Aerosol Particles Using High Lateral Resolution TOF-SIMS

On the benefits of using multivariate analysis in mass spectrometric studies of combustion-generated aerosols

“…Mass defect analysis is used to assign a molecular formula to the recorded accurate mass 50,51 . By convention, the mass defect of 12 The mass defect analysis can also be used to simplify the visu-291 alisation of complex mass spectra (e.g. Figures S1 and S2).…”

“…transferred to the mass spectrometer are created (e.g. soot particle aerosol mass spectrometry (SP-AMS) 9 , two-step laser mass spectrometry (L2MS) 10 , time-of-flight secondary ion mass spectrometry (ToF-SIMS) 11,12 ), which often condition their specificity to provide information on either bulk or surface chemical composition. Ultra high resolution mass analyzers as Orbitrap, Fourier transform ion cyclotron resonance (FT-ICR) and high resolution quadrupole time of flight MS can reach a resolving power higher than 90 000 13,14 .…”

ToF‐SIMS analysis of chemical composition of atmospheric aerosols in Beijing

“…22,23 Many scientists have applied ToF-SIMS to analyze the surface composition and imaging of atmospheric particulate matter. 24,25 ToF-SIMS spectra are usually very complex. For example, hundreds of peaks can be found in a single spectrum.…”

“…Time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) is a relatively new method in this area, but due to its high surface sensitivity and remarkable lateral/depth resolution, ToF‐SIMS has become a useful tool for the analysis of chemical composition of PM and even single particles . Many scientists have applied ToF‐SIMS to analyze the surface composition and imaging of atmospheric particulate matter . ToF‐SIMS spectra are usually very complex.…”

A comprehensive protocol for chemical analysis of flame combustion emissions by secondary ion mass spectrometry

“…Time‐of‐flight secondary ion mass spectrometry (TOF‐SIMS) uses a primary ion beam to desorb and ionize the compounds on the sample surface. While TOF‐SIMS is widely used in the field of material sciences, its use in aerosol science is quite limited due to the commonly occurring post‐ionization dissociation reactions that lead to very complex mass spectra.…”