2021
DOI: 10.1038/s41598-021-85275-6
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Characterization of carrier behavior in photonically excited 6H silicon carbide exhibiting fast, high voltage, bulk transconductance properties

Abstract: Unabated, worldwide trends in CO2 production project growth to > 43-BMT per year over the next two decades. Efficient power electronics are crucial to fully realizing the CO2 mitigating benefits of a worldwide smart grid (~ 18% reduction for the United States alone). Even state-of-the-art SiC high voltage junction devices are inefficient because of slow transition times (~ 0.5-μs) and limited switching rates at high voltage (~ 20-kHz at ≥ 15-kV) resulting from the intrinsically limited charge carrier drift … Show more

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Cited by 14 publications
(9 citation statements)
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“…( e , f ) First tests on high gradient cavities operating at 42 kV per cell using SF 6 insulation gas; we anticipate better than twice the performance using oil insulation. ( g , h ) Testing silicon carbide switching using the optical transconductance varistor (OTV) technology 64 . …”
Section: Resultsmentioning
confidence: 99%
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“…( e , f ) First tests on high gradient cavities operating at 42 kV per cell using SF 6 insulation gas; we anticipate better than twice the performance using oil insulation. ( g , h ) Testing silicon carbide switching using the optical transconductance varistor (OTV) technology 64 . …”
Section: Resultsmentioning
confidence: 99%
“…To replace the existing pulsed source, we are testing high repetition rate, single crystal, semi-insulating SiC photoswitches driven by pulsed laser diodes (Fig. 5 g–h) 64 . We have also tested and utilized a configuration that charges capacitors in parallel and selectively discharges them in series to allow output voltage variability, and hence variable control of the electron final energy over a wide range 65 .…”
Section: Resultsmentioning
confidence: 99%
“…To replace the existing pulsed source, we are testing high repetition rate, single crystal, semi-insulating SiC photoswitches driven by pulsed laser diodes (Fig. 5g-5h) [ 60]. We have also tested and utilized a configuration that charges capacitors in parallel and selectively discharges them in series to allow output voltage variability, and hence variable control of the electron final energy over a wide range [ 61].…”
Section: Resultsmentioning
confidence: 99%
“…The power devices (e.g., SBD (Schottky Barrier Diode), MOSFET (Metal-Oxide-Semiconductor Field-Effect Transistor), IGBT (Insulated Gate Bipolar Transistor), etc.) are core components in the fields of the highspeed rail, the electric vehicles, and the national defense 20,21 . Although the total consumption of power devices is not enormous, the local heat flux caused by the transistor gate's leakage current has exceeded 1000 W cm -2 .…”
Section: Introductionmentioning
confidence: 99%