Characterization of CdZnTe crystals grown by HPB method

Pt coldfinger improves quality of Bridgman-grown Cd0.9Zn0.1Te:Bi crystals

“…The interface convexity is defined as the interface deformation at the symmetry axis divided by the crystal's radius. Theoretically, a flat interface under a low radial temperature gradient and nearly constant axial temperature gradient is optimal because it minimizes the thermoelastic stress [16,17], improves crystalline quality, and reduces the density of inclusions. Furthermore, a flat interface suppresses the radial segregation of Zn, and assures better grain selection.…”

Size and distribution of Te inclusions in THM as-grown CZT wafers: The effect of the rate of crystal cooling

“…Hence, for the last two decades, researchers have explored various techniques to grow large CZT crystals free of these flaws. The growth techniques used include high-pressure Bridgman, conventional Bridgman, gradient freeze, and the traveling heater method (THM) [6][7][8][9][10][11][12][13][14]. Among them, THM has proven to be the most promising in yielding many large, uniform single-crystalline CZT and CdTe ingots [11,14].…”

Point Defects in CdZnTe Crystals Grown by Different Techniques

“…[1][2][3][4][5] However, an important drawback here is that the high partial pressure of Cd generates undesirable point defects, viz. Cd vacancies and Te interstitials, with energy levels within the crystal's forbidden band.…”