A model for Cr poisoning of the cathode functional layer ͑FL͒ in a solid oxide fuel cell ͑SOFC͒ is developed. The model includes the FL performance equations and the rate equation for electrochemical deposition of the volatile Cr hydroxide. A solution to this system shows that in the FL the wave of chromium poisoning forms, which runs from the electrolyte surface to the current collector. At small cell currents, the wave propagation results in a slow linear growth of the activation polarization voltage with time. At large currents, the activation polarization rapidly increases with time and then stays at a nearly constant level corresponding to completely poisoned FL. These results are consistent with recent experiments.One of the key components of a solid oxide fuel cell ͑SOFC͒ stack is interconnect separating individual cells. Interconnect material must obey several contradictory requirements: It should be chemically stable and corrosion-resistant, it should provide high gas toughness and good electric contact between the cells, and its thermal expansion coefficient should match these coefficients of ceramic layers.Nowadays, most widely used interconnects are Cr-containing steels, which fulfill almost all of the requirements listed above. 1 However, Cr poisons the cathode side of the cell, thereby reducing the stack performance and lifetime.The importance of this problem has been recognized more than a decade ago. Since that time, numerous experimental investigations of SOFC cathode poisoning have been published ͑see Ref. 2-7 and the literature cited therein͒. However, the mechanism of Cr deposition still is controversial.Jiang and co-workers 2,6,8,7 assumed that Cr poisoning proceeds through formation of spinel ͑Cr,Mn͒ 3 O 4 at the electrolyte surface. The mechanism proposed involves Mn 2+ ions and hence it depends on local overpotential. Other groups argued that Cr poisoning occurs due to the electrochemical reduction of gaseous Cr hydroxide which contribute to O 2− ion formation. This pathway of Cr deposition is as follows. 9,10,5,7 At high temperature the layer of chromium oxide Cr 2 O 3 forms at the interconnect surface. This oxide reacts with oxygen and with traces of water vapor to form the volatile Cr hydroxide ͑VCH͒ CrO 2 ͑OH͒ 2 ͑g͒The VCH diffuses through the porous current collector to the functional layer ͑FL, Fig. 1͒. In the FL, the VCH is reduced electrochemically with the deposition of solid Cr 2 O 3This mechanism has recently been supported by the X-ray diffraction ͑XRD͒ analysis of poisoned cathodes. 7,11 The experiments 7,11 demonstrate that in mixed-conducting cathodes, Cr 2 O 3 deposition peaks at the electrolyte interface, where the electrochemical activity is maximal. To the same conclusion come authors, 10,5 who studied the degradation of cathodes with the mixed conducting FLs of various thickness.To the best of our knowledge, no models of Cr poisoning of an SOFC cathode have been reported. In this work, we employ our recent model of the catalyst layer performance 12,13 to develop a model...